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المؤلفون: Hyun-Min Sung, Dinh Thi Kieu Anh, Ju-Ri Kim, Viet Tien Luu, Sung-Tae Hong, Hrishikesh Das, Heung Nam Han
المصدر: International Journal of Precision Engineering and Manufacturing-Green Technology. 5:613-621
مصطلحات موضوعية: 0209 industrial biotechnology, Filler metal, Materials science, Renewable Energy, Sustainability and the Environment, Mechanical Engineering, Diffusion, technology, industry, and agriculture, Induction brazing, 02 engineering and technology, 021001 nanoscience & nanotechnology, Industrial and Manufacturing Engineering, 020901 industrial engineering & automation, Lap joint, Management of Technology and Innovation, Brazing, General Materials Science, Electric current, Process time, Composite material, 0210 nano-technology
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b774b31d2c08f12c124ff480a125d6a9Test
https://doi.org/10.1007/s40684-018-0063-0Test -
2Effects of Cu2−xS phase removal on surface potential of Cu2ZnSnS4 thin-films grown by electroplating
المؤلفون: Trang Thi Thu Nguyen, William Jo, Seokhyun Yoon, Gee Yeong Kim, Jin Young Kim, Ju Ri Kim, Kee Doo Lee
المصدر: Current Applied Physics. 14:1665-1668
مصطلحات موضوعية: Kelvin probe force microscope, Band gap, Chemistry, Analytical chemistry, General Physics and Astronomy, engineering.material, Copper indium gallium selenide solar cells, law.invention, chemistry.chemical_compound, law, Etching (microfabrication), Solar cell, engineering, General Materials Science, CZTS, Kesterite, Thin film
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::afa056dad17375e02bb879df1f70d4e3Test
https://doi.org/10.1016/j.cap.2014.09.009Test -
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المؤلفون: Dae-Ho Son, Dae-Hwan Kim, Gee Yeong Kim, Jin-Kyu Kang, William Jo, Ju Ri Kim
المصدر: Nanoscale Research Letters
مصطلحات موضوعية: Materials science, Conductive atomic force microscopy, Nanotechnology, engineering.material, Kelvin probe force microscopy, law.invention, Cu(In,Ga)Se2, Materials Science(all), Kesterite, Sputtering, law, Microscopy, Solar cell, General Materials Science, Thin film, Kelvin probe force microscope, Nano Express, business.industry, Condensed Matter Physics, engineering, Optoelectronics, Grain boundary, business, Cu2ZnSn(S,Se)4
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::842ab48928de88040be64d8df9e28438Test
http://europepmc.org/articles/PMC3895808Test