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المؤلفون: Byung Ik Choi, Kyung Shik Kim, Sang Hyun Jun, Bongkyun Jang, Jae-Hyun Kim, Jun Ho Kim, Jung Yup Kim
المصدر: Key Engineering Materials. :689-692
مصطلحات موضوعية: Engineering, business.industry, Mechanical Engineering, Mode (statistics), Structural engineering, Mechanics, Bending, Finite element method, Stress (mechanics), Vibration, Bellows, Acceleration, Mechanics of Materials, Normal mode, General Materials Science, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::219280adaf4ebe02c975f62525a8b760Test
https://doi.org/10.4028/www.scientific.net/kem.452-453.689Test -
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المؤلفون: Bongkyun Jang, Jae-Hyun Kim, Hak-Joo Lee, Hyun Ju Choi, Byung Ik Choi
المصدر: Key Engineering Materials. :189-192
مصطلحات موضوعية: Engineering, business.industry, Mechanical Engineering, Stress–strain curve, Constitutive equation, Process (computing), Inverse, Structural engineering, Plasticity, Compression (physics), Displacement (vector), Finite element method, Mechanics of Materials, General Materials Science, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9aa3eb0e0b7ea2de77f8cf29e068ad0fTest
https://doi.org/10.4028/www.scientific.net/kem.417-418.189Test -
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المؤلفون: Bongkyun Jang, Seung Tae Choi, Kyung Shik Kim, Jae-Hyun Kim, Hak-Joo Lee, Kwang-Seop Kim, Jong Hyun Ahn, Chang-Hyun Kim, Seungmin Cho
المصدر: 2D Materials. 4:024002
مصطلحات موضوعية: Materials science, Scanning electron microscope, Nanotechnology, 02 engineering and technology, Chemical vapor deposition, 010402 general chemistry, 01 natural sciences, law.invention, Roll-to-roll processing, law, Electrical resistivity and conductivity, General Materials Science, Graphene, business.industry, Mechanical Engineering, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Finite element method, 0104 chemical sciences, Mechanics of Materials, Electrode, Optoelectronics, NIP, 0210 nano-technology, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::eff48e79fc83c0f38caad55d9ae0a5e5Test
https://doi.org/10.1088/2053-1583/aa57faTest