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1
المؤلفون: Adit D. Singh, Jan Burchard, Bernd Becker, Dominik Erb, Sudhakar M. Reddy
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:2152-2165
مصطلحات موضوعية: Pass transistor logic, Computer science, Logic family, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Automatic test pattern generation, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Reliability engineering, Integrated injection logic, CMOS, Robustness (computer science), Logic gate, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, Software
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::22d44e88640a0bf91be30c9667683521Test
https://doi.org/10.1109/tcad.2017.2772825Test -
2
المؤلفون: Janusz Rajski, Derek Feltham, Nilanjan Mukherjee, Elham Moghaddam, Sudhakar M. Reddy, Justyna Zawada, Yingdi Liu, Cesar Acero, Marek Patyra, Jerzy Tyszer
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25:2949-2961
مصطلحات موضوعية: Engineering, business.industry, Design for testing, 020208 electrical & electronic engineering, Test compression, 02 engineering and technology, Automatic test pattern generation, 020202 computer hardware & architecture, Test (assessment), Hardware and Architecture, Logic gate, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Algorithm, Software, Test data, Volume (compression)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5a3ec1a96f4889637c66871d58d387c0Test
https://doi.org/10.1109/tvlsi.2017.2717844Test -
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المؤلفون: Yi-Cheng Kung, Sudhakar M. Reddy, Kuen-Jong Lee
المصدر: ITC
مصطلحات موضوعية: Bridging (networking), Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Pattern generation, Automatic test pattern generation, Application time, 020202 computer hardware & architecture, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, Fault model, Algorithm, Test data, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6c3b209c73f74751bcb8c490a2b82b98Test
https://doi.org/10.1109/test.2018.8624678Test -
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المؤلفون: Sudhakar M. Reddy, Yi-Cheng Kung, Kuen-Jong Lee
المصدر: ITC-Asia
مصطلحات موضوعية: Set (abstract data type), Computer science, Logic gate, Fault coverage, Hardware_PERFORMANCEANDRELIABILITY, Automatic test pattern generation, Fault model, Fault (power engineering), Algorithm, Test data, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bec8cb9a70eeb97212ad5fbc7e1a0280Test
https://doi.org/10.1109/itc-asia.2018.00011Test -
5
المؤلفون: Bernd Becker, Dominik Erb, Adit D. Singh, Jan Burchard, Sudhakar M. Reddy
المصدر: VTS
مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Hazard (logic), Engineering, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Fault (power engineering), 01 natural sciences, 020202 computer hardware & architecture, law.invention, Reliability engineering, CMOS, law, Logic gate, Embedded system, 0103 physical sciences, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, business, Hardware_LOGICDESIGN, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f7654fd000169765d852391a1684dda2Test
https://doi.org/10.1109/vts.2017.7928943Test -
6
المؤلفون: Irith Pomeranz, Sudhakar M. Reddy
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19:1907-1911
مصطلحات موضوعية: Engineering, business.industry, Logic simulation, Hardware_PERFORMANCEANDRELIABILITY, Automatic test pattern generation, Fault detection and isolation, Reliability engineering, Fault indicator, Stuck-at fault, Hardware and Architecture, Robustness (computer science), Control theory, Test set, Fault coverage, Electrical and Electronic Engineering, business, human activities, Software
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::11fec88d8fca4d1c5b912be87ea72b6fTest
https://doi.org/10.1109/tvlsi.2010.2057459Test -
7
المؤلفون: Sudhakar M. Reddy, Irith Pomeranz
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19:1104-1108
مصطلحات موضوعية: Engineering, State variable, business.industry, Context (language use), Propagation delay, Fault detection and isolation, Hardware and Architecture, Fault coverage, Electronic engineering, Point (geometry), Electrical and Electronic Engineering, business, Algorithm, Software, Broadside, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d13c289f774d42827ca4fdb3fb650be8Test
https://doi.org/10.1109/tvlsi.2010.2044049Test -
8
المؤلفون: Irith Pomeranz, Sudhakar M. Reddy
المصدر: ACM Transactions on Design Automation of Electronic Systems. 16:1-21
مصطلحات موضوعية: Cycles per instruction, Computer science, Real-time computing, Scan chain, Clock gating, Dissipation, Computer Graphics and Computer-Aided Design, Computer Science Applications, Test vector, Test set, Fault coverage, Electronic engineering, Electrical and Electronic Engineering, Complement (set theory)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::09cfbc8cb9cf31760aa676da2f48047aTest
https://doi.org/10.1145/1929943.1929949Test -
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المؤلفون: Irith Pomeranz, Sudhakar M. Reddy
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19:142-146
مصطلحات موضوعية: Very-large-scale integration, Combinational logic, Engineering, business.industry, Scan chain, Context (language use), Hardware and Architecture, Logic gate, Fault coverage, State (computer science), Electrical and Electronic Engineering, Constant (mathematics), business, Algorithm, Software
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::84f0e51abd2ee6168edf63d7015aa1b5Test
https://doi.org/10.1109/tvlsi.2009.2030811Test -
10
المؤلفون: Irith Pomeranz, Sudhakar M. Reddy
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18:1533-1543
مصطلحات موضوعية: Very-large-scale integration, Engineering, business.industry, Real-time computing, Hardware_PERFORMANCEANDRELIABILITY, Chip, Fault (power engineering), Fault indicator, Stuck-at fault, Hardware and Architecture, Fault coverage, Preprocessor, Electrical and Electronic Engineering, Fault model, business, Algorithm, Software
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ce9320c12ce995bbea01dd311fd5cda0Test
https://doi.org/10.1109/tvlsi.2009.2025503Test