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1دورية أكاديمية
المصدر: Measurement ; volume 82, page 155-160 ; ISSN 0263-2241
مصطلحات موضوعية: Applied Mathematics, Electrical and Electronic Engineering, Condensed Matter Physics, Instrumentation
الإتاحة: https://doi.org/10.1016/j.measurement.2015.12.037Test
https://api.elsevier.com/content/article/PII:S0263224115006971?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0263224115006971?httpAccept=text/plainTest -
2دورية أكاديمية
المؤلفون: Iida, H, Shimada, Y, Komiyama, K
المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 60, issue 7, page 2308-2313 ; ISSN 0018-9456 1557-9662
مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation
الإتاحة: https://doi.org/10.1109/tim.2010.2091298Test
http://xplorestaging.ieee.org/ielx5/19/5784399/05740353.pdf?arnumber=5740353Test -
3دورية أكاديمية
المؤلفون: Iida, H., Shimada, Y., Komiyama, K.
المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 58, issue 4, page 1090-1096 ; ISSN 0018-9456 1557-9662
مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation
الإتاحة: https://doi.org/10.1109/tim.2008.2008085Test
http://xplorestaging.ieee.org/ielx5/19/4799271/04696012.pdf?arnumber=4696012Test -
4دورية أكاديمية
المؤلفون: Widarta, A., Iida, H., Kawakami, T.
المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 56, issue 2, page 641-645 ; ISSN 0018-9456
مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation
الإتاحة: https://doi.org/10.1109/tim.2007.891133Test
http://xplorestaging.ieee.org/ielx5/19/4126824/04126927.pdf?arnumber=4126927Test -
5دورية أكاديمية
المؤلفون: Yoshida, K., Takahashi, Y., Iida, H.
المصدر: IEEE Transactions on Applied Superconductivity ; volume 16, issue 2, page 775-778 ; ISSN 1051-8223
مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1109/tasc.2006.873251Test
http://xplorestaging.ieee.org/ielx5/77/34433/01642962.pdf?arnumber=1642962Test -
6دورية أكاديمية
المؤلفون: Sang-Keun Woo, Watabe, H., Yong Choi, Kyeong Min Kim, Chang Choon Park, Bloomfield, P.M., Iida, H.
المصدر: IEEE Transactions on Nuclear Science ; volume 51, issue 3, page 782-788 ; ISSN 0018-9499
مصطلحات موضوعية: Electrical and Electronic Engineering, Nuclear Energy and Engineering, Nuclear and High Energy Physics
الإتاحة: https://doi.org/10.1109/tns.2004.829786Test
http://xplorestaging.ieee.org/ielx5/23/29096/01310598.pdf?arnumber=1310598Test -
7دورية أكاديمية
المؤلفون: Deloar, H.M., Watabe, H., Kyeong Min Kim, Aoi, T., Kunieda, E., Fujii, H., Iida, H.
المصدر: IEEE Transactions on Nuclear Science ; volume 51, issue 3, page 625-630 ; ISSN 0018-9499
مصطلحات موضوعية: Electrical and Electronic Engineering, Nuclear Energy and Engineering, Nuclear and High Energy Physics
الإتاحة: https://doi.org/10.1109/tns.2004.829752Test
http://xplorestaging.ieee.org/ielx5/23/29096/01310574.pdf?arnumber=1310574Test -
8دورية أكاديمية
المؤلفون: Uchida, A., Iida, H., Maki, N., Osawa, M., Yoshimori, S.
المصدر: IEEE Transactions on Appiled Superconductivity ; volume 14, issue 4, page 2064-2070 ; ISSN 1051-8223
مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1109/tasc.2004.838314Test
http://xplorestaging.ieee.org/ielx5/77/29856/01362684.pdf?arnumber=1362684Test -
9دورية أكاديمية
المصدر: IEEE Transactions on Components and Packaging Technologies ; volume 25, issue 1, page 164-168 ; ISSN 1521-3331
الإتاحة: https://doi.org/10.1109/6144.991189Test
http://xplorestaging.ieee.org/ielx5/6144/21371/00991189.pdf?arnumber=991189Test -
10دورية أكاديمية
المؤلفون: Shidahara, M., Watabe, H., Kyeong Min Kim, Hachiya, T., Sayama, I., Kanno, I., Nakamura, T., Iida, H.
المصدر: IEEE Transactions on Nuclear Science ; volume 49, issue 1, page 5-11 ; ISSN 0018-9499 1558-1578
مصطلحات موضوعية: Electrical and Electronic Engineering, Nuclear Energy and Engineering, Nuclear and High Energy Physics
الإتاحة: https://doi.org/10.1109/tns.2002.998673Test
http://xplorestaging.ieee.org/ielx5/23/21549/00998673.pdf?arnumber=998673Test