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1دورية أكاديمية
المساهمون: Vetenskapsrådet, Stiftelsen för Kunskaps- och Kompetensutveckling, Mälardalen University
المصدر: Real-Time Systems ; volume 59, issue 1, page 35-68 ; ISSN 0922-6443 1573-1383
مصطلحات موضوعية: Electrical and Electronic Engineering, Control and Optimization, Computer Networks and Communications, Computer Science Applications, Modeling and Simulation, Control and Systems Engineering
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المؤلفون: Alessandro V. Papadopoulos, Kunal Agrawal, Enrico Bini, Sanjoy Baruah
مصطلحات موضوعية: Control and Optimization, Computer Networks and Communications, Control and Systems Engineering, Multi-threaded applications, Modeling and Simulation, Feedback-based resource management, Multi-core scheduling, Electrical and Electronic Engineering, Computer Science Applications
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::82167807a5b86fe9e15739395069cbffTest
http://hdl.handle.net/2318/1876516Test -
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المصدر: Sensors and Actuators A: Physical. 295:259-265
مصطلحات موضوعية: 010302 applied physics, Physics, business.industry, Bandwidth (signal processing), Detector, Metals and Alloys, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Cutoff frequency, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Resonator, Optics, CMOS, Electromagnetic coil, Proximity sensor, 0103 physical sciences, Colpitts oscillator, Electrical and Electronic Engineering, 0210 nano-technology, business, Instrumentation
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dcc913af4bbd4d5ca96162d3b91f70edTest
https://doi.org/10.1016/j.sna.2019.05.041Test -
4مؤتمر
المؤلفون: Catalano, A. P., Magnani, A., D'Alessandro, V., Codecasa, L., Zampardi, P. J., Moser, B., Rinaldi, N.
المساهمون: Catalano, A.P., Catalano, A. P., Magnani, A., D'Alessandro, V., Codecasa, L., Zampardi, P. J., Moser, B., Rinaldi, N.
مصطلحات موضوعية: Design Of Experiments (DOE), finite-element method (FEM), heterojunction bipolar transistor (HBT), thermal resistance, Electrical and Electronic Engineering, Instrumentation
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9781509065073; info:eu-repo/semantics/altIdentifier/wos/WOS:000426907000059; ispartofbook:PRIME 2017 - 13th Conference on PhD Research in Microelectronics and Electronics, Proceedings; 13th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2017; firstpage:233; lastpage:236; numberofpages:4; http://hdl.handle.net/11311/1046847Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85027585885
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5دورية أكاديمية
المساهمون: SNSF
المصدر: Sensors and Actuators A: Physical ; volume 295, page 259-265 ; ISSN 0924-4247
مصطلحات موضوعية: Electrical and Electronic Engineering, Metals and Alloys, Surfaces, Coatings and Films, Condensed Matter Physics, Instrumentation, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016/j.sna.2019.05.041Test
https://api.elsevier.com/content/article/PII:S092442471831567X?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S092442471831567X?httpAccept=text/plainTest -
6مؤتمر
المؤلفون: Di Napoli, F., Magnani, A., Coppola, M., Guerriero, P., D'Alessandro, V., Tricoli, P., Daliento, S., CODECASA, LORENZO
المساهمون: Di Napoli, F., Magnani, A., Coppola, M., Guerriero, P., D'Alessandro, V., Codecasa, Lorenzo, Tricoli, P., Daliento, S.
مصطلحات موضوعية: Dynamic Compact Thermal Modeling (DCTM), Power converter failure, Power module, Real-time temperature estimation, Electrical and Electronic Engineering
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-78561-300-5; ispartofbook:IET Conference Publications; 5th IET International Conference on Renewable Power Generation, RPG 2016; firstpage:73 (6 .); lastpage:73 (6 .); http://hdl.handle.net/11311/1027664Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85008975632; www.ietdl.org/CP
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7مؤتمر
المؤلفون: D'Alessandro, V., Magnani, A., Di Napoli, F., Guerriero, P., Daliento, S., CODECASA, LORENZO
المساهمون: D'Alessandro, V., Magnani, A., Codecasa, Lorenzo, Di Napoli, F., Guerriero, P., Daliento, S.
مصطلحات موضوعية: Electrothermal analysi, numerical simulation, shading effect, thermal feedback, Energy Engineering and Power Technology, Renewable Energy, Sustainability and the Environment, Electrical and Electronic Engineering
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9781479987047; info:eu-repo/semantics/altIdentifier/wos/WOS:000380609800108; ispartofbook:5th International Conference on Clean Electrical Power: Renewable Energy Resources Impact, ICCEP 2015; 5th International Conference on Clean Electrical Power, ICCEP 2015; firstpage:682; lastpage:688; numberofpages:7; http://hdl.handle.net/11311/1027623Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84946606895
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8دورية أكاديمية
المؤلفون: Di Napoli, F., Guerriero, P., d' Alessandro, V., Daliento, S.
المصدر: IEEE Journal of Photovoltaics ; volume 5, issue 5, page 1428-1434 ; ISSN 2156-3381 2156-3403
مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1109/jphotov.2015.2448416Test
http://xplorestaging.ieee.org/ielx7/5503869/7208912/07152818.pdf?arnumber=7152818Test -
9دورية أكاديمية
المؤلفون: Jacquet, T., Sasso, G., Chakravorty, A., Rinaldi, N., Aufinger, K., Zimmer, T., d'Alessandro, V., Maneux, C.
المساهمون: European Commission
المصدر: Microelectronics Reliability ; volume 55, issue 9-10, page 1433-1437 ; ISSN 0026-2714
مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016/j.microrel.2015.06.092Test
https://api.elsevier.com/content/article/PII:S0026271415001845?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0026271415001845?httpAccept=text/plainTest -
10دورية أكاديمية
المؤلفون: Metzger, A.G., d’Alessandro, V., Rinaldi, N., Zampardi, P.J.
المصدر: Microelectronics Reliability ; volume 53, issue 9-11, page 1471-1475 ; ISSN 0026-2714
مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016/j.microrel.2013.06.013Test
https://api.elsevier.com/content/article/PII:S0026271413001650?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0026271413001650?httpAccept=text/plainTest