دورية أكاديمية
Describing mechanical damage evolution through in situ electrical resistance measurements
| العنوان: | Describing mechanical damage evolution through in situ electrical resistance measurements |
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| المؤلفون: | Gebhart, David D., Krapf, Anna, Merle, Benoit, Gammer, Christoph, Cordill, Megan J. |
| سنة النشر: | 2023 |
| المجموعة: | University of Kassel: KOBRA (Kasseler Online Bibliothek Repository und Archiv) |
| مصطلحات موضوعية: | electrical properties and parameters, electronic devices, metallization process, cracks, electrical resistivity, electrical conductor, scanning electron microscopy, fatigue testing, thin films, electron backscatter diffraction, ddc:620, ddc:660, swd:Elektrische Eigenschaft, swd:Elektronisches Gerät, swd:Metallisieren, swd:Riss, swd:Elektrischer Leiter, swd:Rasterelektronenmikroskopie, swd:Materialermüdung, swd:Dünne Schicht, swd:Elektronenrückstreubeugung |
| الوصف: | This work was supported by the Austrian Science Fund (FWF) (Project I, No. 4384-N) and the German Research Foundation (DFG) (No. Grant ME-4368/8) within the framework of the D-A-CH cooperation FATIFACE. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| العلاقة: | I 4384-N, ME-4368/8; http://doi.org/doi:10.17170/kobra-202308018551Test |
| DOI: | 10.17170/kobra-202308018551 |
| الإتاحة: | https://doi.org/10.17170/kobra-202308018551Test https://doi.org/10.1116/6.0002362Test |
| حقوق: | http://creativecommons.org/licenses/by/4.0Test/ ; open access |
| رقم الانضمام: | edsbas.87459EC8 |
| قاعدة البيانات: | BASE |
| DOI: | 10.17170/kobra-202308018551 |
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