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1
المؤلفون: Izabela Wierucka, Anna Zawada-Tomkiewicz
المصدر: Measurement. 114:208-217
مصطلحات موضوعية: 0209 industrial biotechnology, Engineering, Quality management, business.industry, Applied Mathematics, media_common.quotation_subject, 020208 electrical & electronic engineering, Cyber-physical system, 02 engineering and technology, Condensed Matter Physics, Reliability engineering, Screw thread, 020901 industrial engineering & automation, Quality management system, 0202 electrical engineering, electronic engineering, information engineering, Quality (business), Product (category theory), Electrical and Electronic Engineering, business, Instrumentation, Quality assurance, Software quality control, media_common
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::395dba793410d1fdc5c83aa3c35d39eaTest
https://doi.org/10.1016/j.measurement.2017.09.021Test -
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المؤلفون: Grzegorz Królczyk, Anna Zawada-Tomkiewicz, Katarzyna Tandecka, Dariusz Lipiński, Filip Szafraniec, Wojciech Kacalak
المصدر: Measurement. 165:108068
مصطلحات موضوعية: Surface (mathematics), Materials science, Orientation (computer vision), Applied Mathematics, 020208 electrical & electronic engineering, 010401 analytical chemistry, Abrasive, Mechanical engineering, 02 engineering and technology, Active surface, Condensed Matter Physics, 01 natural sciences, 0104 chemical sciences, Characterization (materials science), Grinding, Metrology, Machining, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Instrumentation
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6083a90a57cbf175e22627f9d7db5f44Test
https://doi.org/10.1016/j.measurement.2020.108068Test -
3دورية أكاديمية
المؤلفون: Zawada-Tomkiewicz, Anna, Wierucka, Izabela
المصدر: Measurement ; volume 114, page 208-217 ; ISSN 0263-2241
مصطلحات موضوعية: Applied Mathematics, Electrical and Electronic Engineering, Condensed Matter Physics, Instrumentation
الإتاحة: https://doi.org/10.1016/j.measurement.2017.09.021Test
https://api.elsevier.com/content/article/PII:S0263224117305869?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0263224117305869?httpAccept=text/plainTest -
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المؤلفون: Steven McIntosh, Alex C. Tomkiewicz, Michael Meloni
المصدر: Solid State Ionics. 260:55-59
مصطلحات موضوعية: Phase transition, Surface oxygen, Chemistry, Analytical chemistry, chemistry.chemical_element, General Chemistry, Condensed Matter Physics, Oxygen, Cathode, law.invention, Dielectric spectroscopy, law, Electrode, General Materials Science, Double perovskite, Specific resistance
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::eb2abd3124f7ca519dfdfd3486d8752dTest
https://doi.org/10.1016/j.ssi.2014.03.015Test -
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المؤلفون: Alex C. Tomkiewicz, Steven McIntosh, Mazin A. Tamimi, Ashfia Huq
المصدر: Solid State Ionics. 253:27-31
مصطلحات موضوعية: Diffraction, In situ, Chemistry, Inorganic chemistry, Neutron diffraction, Analytical chemistry, General Chemistry, Crystal structure, Partial pressure, Condensed Matter Physics, Synchrotron, law.invention, Thermogravimetry, law, General Materials Science, Stoichiometry
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::71f219ea3e8f950737d44160e7e7b036Test
https://doi.org/10.1016/j.ssi.2013.08.026Test -
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المؤلفون: Hiroyuki Hasegawa, M. Miczek, Boguslawa Adamowicz, S. Arabasz, Dietrich R. T. Zahn, J. Szuber, János Mizsei, Pawel Tomkiewicz
المصدر: Surface Science. 603:498-502
مصطلحات موضوعية: Kelvin probe force microscope, Chemistry, Surface photovoltage, Fermi level, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, symbols.namesake, Dipole, Band bending, Ionization, Dember effect, Materials Chemistry, symbols, Atomic physics, Surface states
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::846b9fd45c94767351deb1b7bfc1ff12Test
https://doi.org/10.1016/j.susc.2008.12.009Test -
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المؤلفون: Hiroyuki Hasegawa, Boguslawa Adamowicz, M. Miczek, Pawel Tomkiewicz, J. Szuber
المصدر: Applied Surface Science. 254:8046-8049
مصطلحات موضوعية: Photoluminescence, Condensed matter physics, Passivation, Annealing (metallurgy), Chemistry, Fermi level, General Physics and Astronomy, Fermi surface, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, Condensed Matter::Materials Science, symbols.namesake, Density of states, symbols, Order of magnitude, Surface states
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::10399e8e47cf390cac7142ad7b7868ccTest
https://doi.org/10.1016/j.apsusc.2008.03.020Test -
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المؤلفون: Pawel Tomkiewicz, J. Szuber, Adolf Winkler, Thomas Chassé, Maciej Krzywiecki
المصدر: Applied Surface Science. 254:8035-8040
مصطلحات موضوعية: Auger electron spectroscopy, Hydrogen, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Epitaxy, Surfaces, Coatings and Films, chemistry, X-ray photoelectron spectroscopy, Etching (microfabrication), Thin film, Carbon, Molecular beam epitaxy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ce825a962f0955dd1d210617d504ffffTest
https://doi.org/10.1016/j.apsusc.2008.03.074Test -
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المؤلفون: Adolf Winkler, J. Szuber, Pawel Tomkiewicz
المصدر: Applied Surface Science. 252:7647-7658
مصطلحات موضوعية: Auger electron spectroscopy, Hydrogen, Photoemission spectroscopy, Chemistry, Fermi level, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Fermi surface, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, symbols.namesake, symbols, Work function, Spectroscopy, Surface states
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::72ebbcc6809f2af96d2a463b4f587ec6Test
https://doi.org/10.1016/j.apsusc.2006.03.060Test -
10دورية أكاديمية
المؤلفون: Tomkiewicz, Alex C., Meloni, Michael, McIntosh, Steven
المساهمون: Lehigh University
المصدر: Solid State Ionics ; volume 260, page 55-59 ; ISSN 0167-2738
مصطلحات موضوعية: Condensed Matter Physics, General Materials Science, General Chemistry
الإتاحة: https://doi.org/10.1016/j.ssi.2014.03.015Test
https://api.elsevier.com/content/article/PII:S0167273814001362?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0167273814001362?httpAccept=text/plainTest