-
1
المؤلفون: V Ranki, K Saarinen
المصدر: Journal of Physics: Condensed Matter. 15:S2791-S2801
مصطلحات موضوعية: Positron, Chemistry, Annealing (metallurgy), Impurity, Vacancy defect, Doping, General Materials Science, Irradiation, Electron, Atomic physics, Condensed Matter Physics, Epitaxy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d72d065d915908f02513efd1a3d0a85eTest
https://doi.org/10.1088/0953-8984/15/39/003Test -
2
المؤلفون: K Saarinen, H. M. Fretwell, G Dlubek
المصدر: Journal of Polymer Science Part B: Polymer Physics. 36:1513-1528
مصطلحات موضوعية: Polytetrafluoroethylene, Materials science, Polymers and Plastics, Analytical chemistry, Atmospheric temperature range, Polyethylene, Condensed Matter Physics, Thermal expansion, Amorphous solid, Crystal, chemistry.chemical_compound, Volume (thermodynamics), chemistry, Polymer chemistry, Materials Chemistry, Physical and Theoretical Chemistry, Glass transition
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ced17b033e797f6bbc31d2caff2947deTest
https://doi.org/10.1002Test/(sici)1099-0488(19980715)36:9<1513::aid-polb9>3.0.co;2-k -
3
المؤلفون: Ha Post, W. Werner, R. Humke, R. Schuhmann, T. Briolat, A. Dehbi, Yves Ousten, P. Letullier, Wolfgang Wondrak, G. Lekens, K. Saarinen
المساهمون: Import, Ims
مصطلحات موضوعية: Engineering, business.industry, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Automotive industry, Mechanical engineering, Mechatronics, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), visual_art, Electronic component, Qualification testing, visual_art.visual_art_medium, Systems engineering, Reliability of electronic components, Test requirements, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
وصف الملف: 46324 bytes; application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e6164bf55bc64c94f891a162b4e3d498Test
http://hdl.handle.net/1942/936Test