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1مؤتمر
المؤلفون: Tan, Ye, Kiekens, Kim, Kruth, Jean-Pierre, Voet, André, Dewulf, Wim
المساهمون: Tan, Ye
مصطلحات موضوعية: Computed Tomography, Industrial CT
وصف الملف: 867442 bytes; application/pdf
العلاقة: Computed Tomography Applications; DGZFP-Proceedings BB 128-CD; International Symposium on Digital Industrial Radiology and Computed Tomography location:Berlin, Germany date:20-22 June 2011; https://lirias.kuleuven.be/handle/123456789/319982Test; https://lirias.kuleuven.be/bitstream/123456789/319982/1//Material+Dependent+Thresholding+for+Dimensional+X-ray+Computed+Tomography-TanYe.pdfTest
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2دورية أكاديمية
المؤلفون: Wang, Fu-Li, Tan, Ye-Ying, Gu, Xiang-Min, Li, Tian-Ran, Lu, Guang-Ming, Liu, Gang, Huo, Tian-Long
المساهمون: Li, TR (reprint author), Chinese Peoples Liberat Army Gen Hosp, Dept Radiol, Affiliated Hosp 1, Beijing 100048, Peoples R China., Chinese Peoples Liberat Army Gen Hosp, Affiliated Hosp 1, Dept Hosp Management, Beijing 100048, Peoples R China., Xuzhou Ctr Hosp, Dept Radiol, Xuzhou 221000, Jiangsu, Peoples R China., Chinese Peoples Liberat Army Gen Hosp, Dept Radiol, Affiliated Hosp 1, Beijing 100048, Peoples R China., Nanjing Gen Hosp Chinese PLA, Dept Radiol, Nanjing 210000, Jiangsu, Peoples R China., Peking Univ, Dept Radiol, Peoples Hosp, Beijing 100048, Peoples R China.
المصدر: CSCD ; SCI ; 万方 ; http://d.g.wanfangdata.com.cn/Periodical_zhcmj201624005.aspxTest
مصطلحات موضوعية: 2-[F-18]-fluoro-2-deoxy-D-glucose, 2-[F-18]-fluoro-2-deoxy-D-glucose and 3-deoxy-3-[F-18]-fluorothymidine, Computed Tomography, Lung Cancer, Positron Emission Tomography, Solitary Pulmonary Nodules, Standardized Uptake Value, KI-67 IMMUNOHISTOCHEMISTRY, CELL PROLIFERATION, PET/CT, MANAGEMENT, F-18-FDG, CT, VALIDATION, THYMIDINE, TUMOR
العلاقة: CHINESE MEDICAL JOURNAL.2016,129(24),2926-2935.; 1515922; http://hdl.handle.net/20.500.11897/458007Test; WOS:000391576400005
الإتاحة: https://doi.org/20.500.11897/458007Test
https://doi.org/10.4103/0366-6999.195468Test
https://hdl.handle.net/20.500.11897/458007Test -
3دورية أكاديمية
المؤلفون: Angel, Jais, De Chiffre, Leonardo, Kruth, Jean-Pierre, Tan, Ye, Dewulf, Wim
مصطلحات موضوعية: Computed tomography, Performance evaluation, Statistical methodologies
العلاقة: CIRP Journal of Manufacturing Science and Technology vol:11 pages:68-72; https://lirias.kuleuven.be/handle/123456789/579108Test
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4مؤتمر
المؤلفون: Tan, Ye, Kiekens, Kim, Welkenhuyzen, Frank, Kruth, Jean-Pierre, Dewulf, Wim
مصطلحات موضوعية: Computed Tomography, Metrology, Beam Hardening Correction
وصف الملف: 1294532 bytes; application/msword
العلاقة: Green Manufacturing for a Blue Planet; International Conference on Competitive Manufacturing pages:137-143; International Conference on Competitive Manufacturing edition:13 location:Stellenbosch, South Africa date:30 January - 1 February 2013; https://lirias.kuleuven.be/handle/123456789/387275Test; https://lirias.kuleuven.be/bitstream/123456789/387275/1//Defining+the+optimal+beam+hardening+correction+parameters+for+CT+dimensional+metrology+applications.docxTest
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5
المؤلفون: Boeckmans, Bart, Tan, Ye, Welkenhuyzen, Frank, Guo, Yansong, Dewulf, Wim, Kruth, Jean-Pierre
مصطلحات موضوعية: Computed Tomography, Laser Scanning, Roughness Offset, VisionCMM, CMM, Dimensional metrology
وصف الملف: application/pdf; application/octet-stream
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=od______1131::fb5bff251b088bb61e63b9a84bad7190Test
https://lirias.kuleuven.be/handle/123456789/507695Test -
6مؤتمر
المؤلفون: Kiekens, Kim, Tan, Ye, Welkenhuyzen, Frank, Kruth, Jean-Pierre, Dewulf, Wim
مصطلحات موضوعية: computed tomography, uncertainty
العلاقة: Conference on Industrial Computed Tomography location:Wels, Austria date:19-21 September 2012; https://lirias.kuleuven.be/handle/123456789/350492Test
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7دورية أكاديمية
المؤلفون: Dewulf, Wim, Kiekens, Kim, Tan, Ye, Welkenhuyzen, Frank, Kruth, Jean-Pierre
المصدر: CIRP Annals - Manufacturing Technology; May2013, Vol. 62 Issue 1, p535-538, 4p
مصطلحات موضوعية: UNCERTAINTY (Information theory), PREDICATE calculus, DIMENSIONAL analysis, COMPUTED tomography, INDUSTRIES, QUALITY control
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8دورية أكاديمية
المؤلفون: Tan, Ye, Kiekens, Kim, Welkenhuyzen, Frank, Angel, J, Chiffre, L De, Kruth, Jean-Pierre, Dewulf, Wim
المصدر: Measurement Science & Technology; Jun2014, Vol. 25 Issue 6, p1-1, 1p
مصطلحات موضوعية: X-ray computed microtomography, COMPUTED tomography, COORDINATE measuring machines, CALIBRATION, X-ray scattering, METROLOGY