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المؤلفون: Hu Zhanyuan, Yang Huishan, Bai Wenqi, Kunghong Lee, Huang Zhisen, Wang Shiming
المصدر: 2020 China Semiconductor Technology International Conference (CSTIC).
مصطلحات موضوعية: Materials science, business.industry, Junction leakage, Hardware_PERFORMANCEANDRELIABILITY, Threshold voltage, Reduction (complexity), CMOS, Hardware_GENERAL, Power consumption, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Nanoscale mosfet, Current (fluid), business, Leakage (electronics)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::051bd7b99082f283c8ccad673e4e6b63Test
https://doi.org/10.1109/cstic49141.2020.9282451Test -
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المؤلفون: Wang Shiming, Bai Wenqi, Huang Zhisen, Yang Huishan, Kunhong Lee, Hu Zhanyuan
المصدر: 2020 China Semiconductor Technology International Conference (CSTIC).
مصطلحات موضوعية: Materials science, business.industry, Low leakage, Hardware_PERFORMANCEANDRELIABILITY, Iddq testing, CMOS, Hardware_GENERAL, Power consumption, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Current (fluid), business, Hardware_LOGICDESIGN, Electronic circuit, Leakage (electronics)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::335e8479bf90cd187e2f933ffc7b716eTest
https://doi.org/10.1109/cstic49141.2020.9282387Test