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المؤلفون: H. Choe, Philip S. Smith, Ko-Min Chang, Joseph Jelemensky, M. Weidner, Thomas R. Toms, Clinton C. K. Kuo, A. Harwood
المصدر: IEEE Journal of Solid-State Circuits. 27:574-582
مصطلحات موضوعية: Engineering, business.industry, Sense amplifier, Circuit design, Integrated circuit, law.invention, Microcontroller, Flash (photography), law, Embedded system, Charge trap flash, Electrical and Electronic Engineering, EPROM, business, Computer hardware, EEPROM
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::cf977b582123fb0840f3633df7c9daf3Test
https://doi.org/10.1109/4.126546Test -
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المؤلفون: B.T. Neel, E.A. Carter, Clinton C. K. Kuo, Joseph Jelemensky, Philip S. Smith, Thomas R. Toms
المصدر: IEEE Journal of Solid-State Circuits. 25:61-67
مصطلحات موضوعية: Very-large-scale integration, Microcontroller, Reliability (semiconductor), CMOS, Computer science, Circuit design, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Static random-access memory, Electrical and Electronic Engineering, Fault detection and isolation, Electronic circuit, Nonvolatile BIOS memory
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::40c5c8d832e109313c8ff0b09377fb32Test
https://doi.org/10.1109/4.50285Test