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المؤلفون: Johannes Moll, James Gregory Couillard, Jayantha Senawiratne, Patrick G. Whiting, Carlo Kosik Williams, Jeffery Cites
المصدر: Solid State Phenomena. :313-317
مصطلحات موضوعية: Photocurrent, Materials science, Deep-level transient spectroscopy, Silicon, Hydrogen, Photoconductivity, Radiochemistry, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Ion implantation, chemistry, General Materials Science, Boron, Spectroscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3d701478afc6457f2891f65107b26de6Test
https://doi.org/10.4028/www.scientific.net/ssp.156-158.313Test -
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المؤلفون: Karl D. Hirschman, James Gregory Couillard, C.G. Shea, Robert George Manley, C. Kosik Williams, Patricia M. Meller, A.M. McCabe, Jayantha Senawiratne
المصدر: 2009 IEEE International SOI Conference.
مصطلحات موضوعية: Electron mobility, Fabrication, Materials science, Silicon, business.industry, Doping, Electrical engineering, Silicon on insulator, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Substrate (electronics), CMOS, chemistry, Logic gate, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3c8d83829562419755440ef29433c3e2Test
https://doi.org/10.1109/soi.2009.5318791Test -
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المصدر: 2009 IEEE International SOI Conference.
مصطلحات موضوعية: Fabrication, Materials science, Silicon, business.industry, Process (computing), Silicon on insulator, chemistry.chemical_element, Substrate (printing), Barrier layer, Semiconductor, chemistry, Electronic engineering, Optoelectronics, business, Material properties
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a3f0dc3d4baaf109852cc464e1cdcb83Test
https://doi.org/10.1109/soi.2009.5318764Test -
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المؤلفون: Jayantha Senawiratne, Johannes Moll, Jeffrey Scott Cites, C. Kosik Williams, Patrick G. Whiting, James Gregory Couillard
المصدر: 2009 IEEE International SOI Conference.
مصطلحات موضوعية: Ion implantation, Materials science, Deep-level transient spectroscopy, Silicon, chemistry, Annealing (metallurgy), Absorption band, Photoconductivity, Doping, Analytical chemistry, chemistry.chemical_element, Spectroscopy, Molecular physics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::03788d017efffc515f738873188d9142Test
https://doi.org/10.1109/soi.2009.5318742Test