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المؤلفون: Moisi, Cobbs C, Delashaw J, Fisahn C, Hoang K, Tubbs Rs, Backous D, Buchanan P, Jeni Page, Klinger D
المصدر: Journal of Spine & Neurosurgery.
مصطلحات موضوعية: Visualization methods, medicine.medical_specialty, Modality (human–computer interaction), Modalities, Endoscope, business.industry, medicine.medical_treatment, Microsurgery, Transsphenoidal approach, Surgery, medicine, Comparison study, Operating microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3ec22e96cf03e6cc3bf18632a6294e46Test
https://doi.org/10.4172/2325-9701.1000259Test -
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المؤلفون: Khorsand, A.R., Sobierajski, R., Louis, E., Bruijn, S., Van Hattum, E.D., Vande Kruijs, R.W.E., Jurek, M., Klinger, D., Pelka, J.B., Juha, L., Burian, T., Chalupsky, J., Cihelka, J., Hajkova, V., Vysin, L., Jastrow, U., Stojanovic, Nenad, Toleikis, S., Wabnitz, H., Tiedtke, K., Sokolowski-Tinten, Klaus, Shymanovich, Uladzimir, Krzywinski, J., Riege Hau, S., London, R., Gleeson, A., Gullikson, E.M., Bijkerk, F., van de Kruijs, R. W. E., Hau-Riege, S.
المساهمون: Faculty of Science and Technology, XUV Optics, Laser Physics & Nonlinear Optics
المصدر: Optics express, 18(2), 700-712. The Optical Society
Optics Express, 18, 700-712مصطلحات موضوعية: Silicon, Materials science, Ultraviolet Rays, chemistry.chemical_element, law.invention, Optics, Optical microscope, law, Materials Testing, Thin film, Reflectometry, Molybdenum, business.industry, Optical Devices, Membranes, Artificial, Equipment Design, Nanosecond, Physik (inkl. Astronomie), Laser, Atomic and Molecular Physics, and Optics, Equipment Failure Analysis, chemistry, Extreme ultraviolet, business, Ultrashort pulse
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c0c5c60983724f940780a1af1a73e667Test
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المؤلفون: Louis, Eric, Khorsand, A.R., Sobierajski, R., van Hattum, E.D., Jurek, M., Klinger, D., Pelka, J.B., Juha, L., Chalupsky, J., Cihelka, J., Hajkova, V., Jastrow, U., Toleikis, S., Wabnitz, H., Tiedtke, K., Gaudin, J., Gullikson, E.M., Bijkerk, Frederik, Juha, Libor, Bajt, Saša, Sobierajski, Ryszard
المساهمون: Laser Physics & Nonlinear Optics
المصدر: Damage to VUV, EUV, and X-Ray Optics II: 21–23 April 2009, Prague, Czech Republic
Damage to VUV, EUV, and X-Ray Optics IIمصطلحات موضوعية: Free electron model, business.industry, Chemistry, Free-electron laser, Laser, law.invention, Optics, Optical microscope, law, METIS-266557, Extreme ultraviolet, Femtosecond, Radiation damage, High-resolution transmission electron microscopy, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f587e9f566034645bde7e931b89d6298Test
https://doi.org/10.1117/12.822257Test