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1
المؤلفون: Jian Zhang, Yin Li Li, Shi Pan, Peng Fei Li, Shi Fa Wu
المصدر: Solid State Phenomena. :859-862
مصطلحات موضوعية: Artifact (error), Materials science, Photon, Microscope, business.industry, Condensed Matter Physics, Sample (graphics), Atomic and Molecular Physics, and Optics, law.invention, Optics, Optical microscope, law, General Materials Science, Near-field scanning optical microscope, business, Refractive index, Quantum tunnelling
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::68c25a9c30e0df88939def889ccb6fc6Test
https://doi.org/10.4028/www.scientific.net/ssp.121-123.859Test -
2
المؤلفون: Jian Zhang, Shi Pan, Guoshu Jian, Wei Suen, Yinli Li, Xiaoqiu Wang, Shifs Wu
المصدر: Ultramicroscopy. 104:1-7
مصطلحات موضوعية: Photon, business.industry, Chemistry, Phase-contrast imaging, Physics::Optics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Optics, Normalized frequency (fiber optics), law, Microscopy, Scanning tunneling microscope, business, Instrumentation, Refractive index, Tip position, Quantum tunnelling
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::612a46fe171977ceb85a11ae82a028e9Test
https://doi.org/10.1016/j.ultramic.2005.01.001Test -
3
المؤلفون: Hong Li, Shifa Wu, Shi Pan, Jian Zhang, Chenbiao Xu, Zhao Wang
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microscope, Materials science, business.industry, Resolution (electron density), Near and far field, law.invention, Optics, Optical microscope, law, Nano, Microscopy, Near-field scanning optical microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3e1093b3f4a21d94afdbd07c23f822d9Test
https://doi.org/10.1117/12.867697Test -
4
المؤلفون: Yinli Li, Wei Sun, Shi Pan, Jian Zhang, Shifa Wu, Kai Xu, Yuqi Huang
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Photon, business.industry, Near-field optics, Photography, Phase (waves), Sample (graphics), law.invention, Optics, law, Computer vision, Near-field scanning optical microscope, Artificial intelligence, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::13c44ae47c7c79b6e67d5255a904cbecTest
https://doi.org/10.1117/12.481728Test -
5
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Optical image, Scanning probe microscopy, Optics, Materials science, business.industry, Atomic force microscopy, business, Sample (graphics), Refractive index, Phase image
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::11f34b201224509e777845d6ca9463d0Test
https://doi.org/10.1117/12.481704Test -
6
المؤلفون: Guoshu Jian, Jisong Wang, Shifa Wu, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Diffraction, Microscope, business.industry, Scanning electron microscope, Chemistry, Scattering, Waveguide (optics), law.invention, Optics, Optical microscope, law, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a8ae86f14a64ad3e8cb0a1f854699d61Test
https://doi.org/10.1117/12.445731Test -
7
المؤلفون: Shifa Wu, Guoshu Jian, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Diffraction, Microscope, Photon, Computer simulation, business.industry, Near and far field, law.invention, Optics, Optical microscope, law, Computer Science::Computer Vision and Pattern Recognition, Computer vision, Artificial intelligence, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::97c699edd0717932608920b2b9259378Test
https://doi.org/10.1117/12.326839Test