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1
المؤلفون: Jian Zhang, Yin Li Li, Shi Pan, Peng Fei Li, Shi Fa Wu
المصدر: Solid State Phenomena. :859-862
مصطلحات موضوعية: Artifact (error), Materials science, Photon, Microscope, business.industry, Condensed Matter Physics, Sample (graphics), Atomic and Molecular Physics, and Optics, law.invention, Optics, Optical microscope, law, General Materials Science, Near-field scanning optical microscope, business, Refractive index, Quantum tunnelling
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::68c25a9c30e0df88939def889ccb6fc6Test
https://doi.org/10.4028/www.scientific.net/ssp.121-123.859Test -
2
المؤلفون: Hong Li, Shifa Wu, Shi Pan, Jian Zhang, Chenbiao Xu, Zhao Wang
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microscope, Materials science, business.industry, Resolution (electron density), Near and far field, law.invention, Optics, Optical microscope, law, Nano, Microscopy, Near-field scanning optical microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3e1093b3f4a21d94afdbd07c23f822d9Test
https://doi.org/10.1117/12.867697Test -
3
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microscope, Materials science, Optical fiber, Cantilever, business.industry, Bent molecular geometry, Physics::Optics, Near and far field, Isotropic etching, law.invention, Optics, law, Fiber, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::31890659718308f934a66e14a395358aTest
https://doi.org/10.1117/12.576244Test -
4
المؤلفون: Yi Zhang, Shi Pan, Anhong Ning, Wei Sun, Lingfeng Song
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Scanning Hall probe microscope, Microscope, Chemistry, business.industry, Scanning electron microscope, Analytical chemistry, Scanning capacitance microscopy, law.invention, Scanning probe microscopy, Optics, law, Scanning ion-conductance microscopy, Electron microscope, Biological imaging, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b05c84697c384795ed8c92ed6f833f59Test
https://doi.org/10.1117/12.570294Test -
5
المؤلفون: Guoshu Jian, Fei Bai, Shifa Wu, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Scanning Hall probe microscope, Optical fiber, Microscope, business.industry, Physics::Optics, Near and far field, Scanning capacitance microscopy, law.invention, Scanning probe microscopy, Optics, Optical microscope, law, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e391d3e6fca29eb4743125fa5042806eTest
https://doi.org/10.1117/12.576464Test -
6
المؤلفون: Guoshu Jian, Jisong Wang, Shifa Wu, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Diffraction, Microscope, business.industry, Scanning electron microscope, Chemistry, Scattering, Waveguide (optics), law.invention, Optics, Optical microscope, law, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a8ae86f14a64ad3e8cb0a1f854699d61Test
https://doi.org/10.1117/12.445731Test -
7
المؤلفون: Shifa Wu, Guoshu Jian, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Diffraction, Microscope, Photon, Computer simulation, business.industry, Near and far field, law.invention, Optics, Optical microscope, law, Computer Science::Computer Vision and Pattern Recognition, Computer vision, Artificial intelligence, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::97c699edd0717932608920b2b9259378Test
https://doi.org/10.1117/12.326839Test