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1تقرير
المؤلفون: Liu XL, Wang LS, Lu DC, Wang D, Wang XH, Lin LY, Liu XL,Chinese Acad Sci,Inst Semicond,Lab Semicond Mat Sci,POB 912,Beijing 100083,Peoples R China. 电子邮箱地址: xlliu@red.semi.ac.cn
مصطلحات موضوعية: Movpe, Gan, Gan Buffer, Heavy Si-doping, 半导体材料, atomic layer deposition, atomic layer epitaxial growth, ale, mle growth, molecular layer epitaxial growth, chemical beam epitaxial growth, cbe, gas source mbe, gsmbe, metalorganic molecular beam epitaxy, mombe, ommbe, chemical vapour deposition, apcvd, chemical vapor deposition, cvd, laser cvd, laser-induced cvd, lpcvd, chemical vapour infiltration, chemical vapor infiltration, cvi, crystal growth from vapour, laser deposition, mocvd
العلاقة: JOURNAL OF CRYSTAL GROWTH; Liu XL; Wang LS; Lu DC; Wang D; Wang XH; Lin LY .The influence of thickness on properties of GaN buffer layer and heavily Si-doped GaN grown by metalorganic vapor-phase epitaxy ,JOURNAL OF CRYSTAL GROWTH ,1998,189(0):287-290; http://ir.semi.ac.cn/handle/172111/13170Test
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المؤلفون: Liu XL, Wang LS, Lu DC, Wang D, Wang XH, Lin LY, Liu XL Chinese Acad Sci Inst Semicond Lab Semicond Mat Sci POB 912 Beijing 100083 Peoples R China. 电子邮箱地址: xlliu@red.semi.ac.cn
مصطلحات موضوعية: Movpe, Gan, Gan Buffer, Heavy Si-doping, 半导体材料, atomic layer deposition, atomic layer epitaxial growth, ale, mle growth, molecular layer epitaxial growth, chemical beam epitaxial growth, cbe, gas source mbe, gsmbe, metalorganic molecular beam epitaxy, mombe, ommbe, chemical vapour deposition, apcvd, chemical vapor deposition, cvd, laser cvd, laser-induced cvd, lpcvd, chemical vapour infiltration, chemical vapor infiltration, cvi, crystal growth from vapour, laser deposition, mocvd
العلاقة: JOURNAL OF CRYSTAL GROWTH, 189; Liu XL; Wang LS; Lu DC; Wang D; Wang XH; Lin LY .The influence of thickness on properties of GaN buffer layer and heavily Si-doped GaN grown by metalorganic vapor-phase epitaxy .见:ELSEVIER SCIENCE BV .JOURNAL OF CRYSTAL GROWTH, 189,PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS ,1998,287-290; http://ir.semi.ac.cn/handle/172111/15077Test