المؤلفون: Ferrer, F. J.¹ fjferrer@us.es, Moreau, E.¹, Vignaud, D.¹ dominique.vignaud@univ-lille1.fr, Deresmes, D.¹, Godey, S.¹, Wallart, X.¹

المصدر: Journal of Applied Physics. Mar2011, Vol. 109 Issue 5, p054307. 6p. 2 Color Photographs, 1 Black and White Photograph, 1 Diagram, 2 Graphs.

مصطلحات موضوعية: *ELECTRON diffraction, *GRAPHITIZATION, *PHOTOEMISSION, *ATOMIC force microscopy, *GRAPHENE

المؤلفون: Moreau, E., Godey, S., Ferrer, F. J., Vignaud, D., Wallart, X., Avila, J., Asensio, M. C., Bournel, F., Gallet, J.-J.

المصدر: Applied Physics Letters; 12/13/2010, Vol. 97 Issue 24, p241907, 3p, 1 Color Photograph, 2 Diagrams, 1 Graph

مصطلحات موضوعية: CRYSTAL growth, GRAPHENE, MOLECULAR beam epitaxy, SILICON carbide, ATOMIC force microscopy, LOW energy electron diffraction, DIFFRACTION patterns, CONDUCTION bands