-
1
المؤلفون: Si-Chen Lee, Wen‐Shiang Liao
المصدر: Journal of Applied Physics. 81:7793-7797
مصطلحات موضوعية: Amorphous silicon, Auger electron spectroscopy, Materials science, Silicon, Annealing (metallurgy), Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, engineering.material, Amorphous solid, chemistry.chemical_compound, Crystallography, Polycrystalline silicon, chemistry, Electron diffraction, engineering, Crystallite
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::93658d31573f951180a42ae64ac9271bTest
https://doi.org/10.1063/1.365389Test -
2
المؤلفون: Wen–Shiang Liao, Si-Chen Lee
المصدر: Japanese Journal of Applied Physics. 36:2073
مصطلحات موضوعية: Amorphous silicon, Materials science, Passivation, Silicon, business.industry, General Engineering, General Physics and Astronomy, chemistry.chemical_element, Chemical vapor deposition, Amorphous solid, chemistry.chemical_compound, chemistry, Thin-film transistor, Plasma-enhanced chemical vapor deposition, Optoelectronics, business, Layer (electronics)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::105d9e9504d084c9d998bf1126cdb566Test
https://doi.org/10.1143/jjap.36.2073Test