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1دورية أكاديمية
المؤلفون: Resnati, Davide, Mannara, Aurelio, Nicosia, Gianluca, Paolucci, Giovanni M., Tessariol, Paolo, Spinelli, Alessandro S., Lacaita, Andrea L., Monzio Compagnoni, Christian
المصدر: IEEE Transactions on Electron Devices. Aug2018, Vol. 65 Issue 8, p3199-3206. 8p.
مصطلحات موضوعية: *SEMICONDUCTOR device reliability, FLASH memory, SEMICONDUCTOR devices, CRYSTAL grain boundaries, ELECTRIC conductivity
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2دورية أكاديمية
المؤلفون: Nicosia, Gianluca, Mannara, Aurelio, Resnati, Davide, Paolucci, Giovanni M., Tessariol, Paolo, Spinelli, Alessandro S., Lacaita, Andrea L., Goda, Akira, Monzio Compagnoni, Christian
المصدر: IEEE Transactions on Electron Devices. Aug2018, Vol. 65 Issue 8, p3207-3213. 7p.
مصطلحات موضوعية: *SEMICONDUCTOR device reliability, FLASH memory, RANDOM noise theory, SEMICONDUCTOR device modeling, CRYSTAL grain boundaries