مراجعة
Comment on 'Steady-state temperature profile for a thin-film resistor under bias' [J. Appl. Phys. 72, 3862 (1992)]
| العنوان: | Comment on 'Steady-state temperature profile for a thin-film resistor under bias' [J. Appl. Phys. 72, 3862 (1992)] |
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| المؤلفون: | Lu, Y.-F. |
| المساهمون: | ELECTRICAL ENGINEERING |
| المصدر: | Scopus |
| سنة النشر: | 1993 |
| المجموعة: | National University of Singapore: ScholarBank@NUS |
| الوصف: | 10.1063/1.355308 ; Journal of Applied Physics ; 74 ; 8 ; 5290- |
| نوع الوثيقة: | review |
| اللغة: | unknown |
| تدمد: | 00218979 |
| العلاقة: | Lu, Y.-F. (1993). Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]. Journal of Applied Physics 74 (8) : 5290-. ScholarBank@NUS Repository. https://doi.org/10.1063/1.355308Test; http://scholarbank.nus.edu.sg/handle/10635/68171Test; A1993MC03000081 |
| الإتاحة: | https://doi.org/10.1063/1.355308Test http://scholarbank.nus.edu.sg/handle/10635/68171Test |
| رقم الانضمام: | edsbas.69B700EC |
| قاعدة البيانات: | BASE |
| تدمد: | 00218979 |
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