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1تقرير
المؤلفون: Hu, Jianbo, Dai, Chengda, Yu, Yuying, Liu, Zijiang, Tan, Ye, Zhou, Xianming, Tan, Hua, Cai, Lingcang, wu, Qiang
المصدر: J. Appl. Phys. 111, 033511 (2012)
مصطلحات موضوعية: Condensed Matter - Materials Science
الوصول الحر: http://arxiv.org/abs/1201.0427Test
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2تقرير
المؤلفون: Rigoard, Philippe, Desai, Mehul J, North, Richard B, Taylor, Rod S, Annemans, Lieven, Greening, Christine, Tan, Ye, Van den Abeele, Carine, Shipley, Jane, Kumar, Krishna
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3دورية أكاديمية
المؤلفون: Tan, Ye, Kiekens, Kim, Welkenhuyzen, Frank, Angel, Jais, De Chiffre, Leonardo, Kruth, Jean-Pierre, Dewulf, Wim
مصطلحات موضوعية: simulation, beam hardening, X-ray Computed Tomography, dimensional metrology
وصف الملف: 848102 bytes; application/pdf
العلاقة: Measurement Science & Technology vol:25 issue:6; https://lirias.kuleuven.be/handle/123456789/424418Test; MST-100147; MST/488542/SPE; https://lirias.kuleuven.be/bitstream/123456789/424418/1//Simulation-aided+investigation+of+beam+hardening+induced+errors+in+CT+dimensional+metrology.pdfTest
الإتاحة: https://doi.org/10.1088/0957-0233/25/6/064014Test
https://lirias.kuleuven.be/handle/123456789/424418Test
https://lirias.kuleuven.be/bitstream/123456789/424418/1//Simulation-aided+investigation+of+beam+hardening+induced+errors+in+CT+dimensional+metrology.pdfTest