Measurement and analysis of periodic coupling in silicon-clad planar waveguides

التفاصيل البيبلوغرافية
العنوان: Measurement and analysis of periodic coupling in silicon-clad planar waveguides
المؤلفون: Mcwright, G. M, Batchman, T. E, Stanziano, M. S
المصدر: IEEE Transactions on Microwave Theory and Techniques. MTT-30
بيانات النشر: United States: NASA Center for Aerospace Information (CASI), 1982.
سنة النشر: 1982
مصطلحات موضوعية: Optics
الوصف: Computer modeling studies indicate that planar dielectric waveguides clad with silicon exhibit a damped periodic oscillation in their attenuation and phase characteristics. The effect is due to a periodic coupling between the lossy, guided modes in the silicon film and the TE0 mode of the dielectric waveguide. Experimental confirmation of the periodic coupling for a wavelength of 632.8 nm is presented. Propagation characteristics for a wavelength of 1150 nm were investigated for application in integrated optical modulators. Frequency filtering properties of silicon-clad waveguides are also examined and it is shown that the silicon thickness controls the filter response curve.
نوع الوثيقة: Report
اللغة: English
الوصول الحر: https://ntrs.nasa.gov/citations/19830030952Test
رقم الانضمام: edsnas.19830030952
قاعدة البيانات: NASA Technical Reports