-
1تقرير
المؤلفون: Qiang Luo, Zhe Guo, Houbing Huang, Qiming Zou, Xiangwei Jiang, Shuai Zhang, Hongjuan Wang, Min Song, Bao Zhang, Hong Chen, Haoshuang Gu, Genquan Han, Xiaofei Yang, Xuecheng Zou, Kai-You Wang, Zhiqi Liu, Jeongmin Hong, Ramamoorthy Ramesh, Long You
العلاقة: IEEE ELECTRON DEVICE LETTERS; http://ir.semi.ac.cn/handle/172111/29399Test
-
2تقرير
المؤلفون: Qiang Luo, Zhe Guo, Houbing Huang, Qiming Zou, Xiangwei Jiang, Shuai Zhang, Hongjuan Wang, Min Song, Bao Zhang, Hong Chen, Haoshuang Gu, Genquan Han, Xiaofei Yang, Xuecheng Zou, Kai-You Wang, Zhiqi Liu, Jeongmin Hong, Ramamoorthy Ramesh, Long You
العلاقة: IEEE ELECTRON DEVICE LETTERS; http://ir.semi.ac.cn/handle/172111/29409Test