المؤلفون: Zhang, Chao, Xi, Wei, Liu, Xinhui, Bai, Gairui, Sun, Jingtong, Yu, Fan

المساهمون: National Key RD Program of China, NSFC

المصدر: 2022 International Joint Conference on Neural Networks (IJCNN)

الإتاحة: https://doi.org/10.1109/ijcnn55064.2022.9892018Test
http://xplorestaging.ieee.org/ielx7/9891857/9889787/09892018.pdf?arnumber=9892018Test

المؤلفون: Zhao, Puyang, Tian, Wei, Xiao, Lefu, Liu, Xinhui, Wu, Jingjin

المصدر: 2022 International Conference on High Performance Big Data and Intelligent Systems (HDIS)

الإتاحة: https://doi.org/10.1109/hdis56859.2022.9991661Test
http://xplorestaging.ieee.org/ielx7/9991245/9991269/09991661.pdf?arnumber=9991661Test

المؤلفون: Sun, Jingtong, Xi, Wei, Bai, Gairui, Liu, Xinhui, Yu, Fan, Zhang, Chao

المساهمون: NSFC

المصدر: 2022 International Joint Conference on Neural Networks (IJCNN)

الإتاحة: https://doi.org/10.1109/ijcnn55064.2022.9892230Test
http://xplorestaging.ieee.org/ielx7/9891857/9889787/09892230.pdf?arnumber=9892230Test

المؤلفون: Liu, Xinhui, Zhang, Chuo

المصدر: 2022 6th Annual International Conference on Data Science and Business Analytics (ICDSBA)

الإتاحة: https://doi.org/10.1109/icdsba57203.2022.00049Test
http://xplorestaging.ieee.org/ielx7/10129406/10129413/10129438.pdf?arnumber=10129438Test

المؤلفون: Zhan, Hailun, Ding, Zhiming, Chang, Mengmeng, Liu, Xinhui

المصدر: 2021 IEEE 33rd International Conference on Tools with Artificial Intelligence (ICTAI)

الإتاحة: https://doi.org/10.1109/ictai52525.2021.00057Test
http://xplorestaging.ieee.org/ielx7/9643150/9643151/09643238.pdf?arnumber=9643238Test

المؤلفون: Zhang, Fusheng, Yang, Kun, Liu, Xinhui, Shang, Yuanhang, Niu, Xiaolong, Lu, Yajuan, Li, Tingting

المصدر: 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)

الإتاحة: https://doi.org/10.1109/sslchinaifws51786.2020.9308780Test
http://xplorestaging.ieee.org/ielx7/9308121/9308663/09308780.pdf?arnumber=9308780Test

المؤلفون: Jia, Honglei, Feng, Xianzhen, Qi, Jiangtao, Liu, Xinhui, Liu, Chunxi, Yang, Yongxi, Li, Yang

المساهمون: Key Laboratory of Bionic Engineering Changchun, Ministry of Education of China-Jilin University (JLU), College of Mechanical Science and Engineering Changchun, Jilin University (JLU), Jilin Province Academy of Agricultural Machinery, Daoliang Li, Yingyi Chen, TC 5, WG 5.14

المصدر: IFIP Advances in Information and Communication Technology ; 7th International Conference on Computer and Computing Technologies in Agriculture (CCTA) ; https://hal.inria.fr/hal-01220849Test ; 7th International Conference on Computer and Computing Technologies in Agriculture (CCTA), Sep 2013, Beijing, China. pp.381-391, ⟨10.1007/978-3-642-54341-8_40⟩

مصطلحات موضوعية: Variable rate technology(VRT), DC motor, PID control, [INFO]Computer Science [cs]

جغرافية الموضوع: Beijing, China

العلاقة: hal-01220849; https://hal.inria.fr/hal-01220849Test; https://hal.inria.fr/hal-01220849/documentTest; https://hal.inria.fr/hal-01220849/file/978-3-642-54341-8_40_Chapter.pdfTest

الإتاحة: https://doi.org/10.1007/978-3-642-54341-8_40Test
https://hal.inria.fr/hal-01220849Test
https://hal.inria.fr/hal-01220849/documentTest
https://hal.inria.fr/hal-01220849/file/978-3-642-54341-8_40_Chapter.pdfTest

المؤلفون: Li, Yifan, Wang, Xuan, Jiang, Zoe L., Qi, Shuhan, Liu, Xinhui, Chen, Qian

المصدر: 2019 IEEE Conference on Computational Intelligence for Financial Engineering & Economics (CIFEr)

الإتاحة: https://doi.org/10.1109/cifer.2019.8759064Test
http://xplorestaging.ieee.org/ielx7/8753112/8759054/08759064.pdf?arnumber=8759064Test

المؤلفون: Wang, Tiejun, Luo, Yansha, Sun, Yiwen, Liu, Xinhui

المصدر: IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium

الإتاحة: https://doi.org/10.1109/igarss.2018.8518347Test
http://xplorestaging.ieee.org/ielx7/8496405/8517275/08518347.pdf?arnumber=8518347Test

المؤلفون: Zheng, Boyuan, Wang, Xin, Liang, Weiquan, Liu, Xinhui

المصدر: 2015 International Conference on Fluid Power and Mechatronics (FPM)

الإتاحة: https://doi.org/10.1109/fpm.2015.7337337Test
http://xplorestaging.ieee.org/ielx7/7325164/7337073/07337337.pdf?arnumber=7337337Test