المؤلفون: Kim, Myungsuk, Park, Jisung, Cho, Geonhee, Kim, Yoona, Orosa, Lois, Mutlu, Onur, Kim, Jihong

المساهمون: Kim, Jihong

العلاقة: International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS, pp.1311-1326; https://hdl.handle.net/10371/186545Test; 000541369300083; 2-s2.0-85082385658; 163142

الإتاحة: https://doi.org/10.1145/3373376.3378490Test
https://hdl.handle.net/10371/186545Test

المؤلفون: Shim, Youngseop, Kim, Myungsuk, Chun, Myoungjun, Park, Jisung, Kim, Yoona, Kim, Jihong

المساهمون: Kim, Jihong

العلاقة: Proceedings of the Annual International Symposium on Microarchitecture, MICRO, pp.211-223; https://hdl.handle.net/10371/186093Test; 000519057400016; 2-s2.0-85074454749; 163214

الإتاحة: https://doi.org/10.1145/3352460.3358311Test
https://hdl.handle.net/10371/186093Test

المؤلفون: Lee, Sanggu, Kim, Yoona, Lee, Dusol, Choi, Inhyuk, Kim, Jihong

المساهمون: Lee, Sanggu

العلاقة: HotStorage 2022 - Proceedings of the 2022 14th ACM Workshop on Hot Topics in Storage and File Systems, pp.113-118; https://hdl.handle.net/10371/184813Test; 2-s2.0-85134187465; 168979

الإتاحة: https://doi.org/10.1145/3538643.3539749Test
https://hdl.handle.net/10371/184813Test

المؤلفون: Kim, Yoona, Choi, Inhyuk, Park, Juhyung, Lee, Jaeheon, Lee, Sungjin, Kim, Jihong

العلاقة: http://hdl.handle.net/20.500.11750/47806Test; 2-s2.0-85159306350; USENIX Conference on File and Storage Technologies, pp.441 - 456; https://www.usenix.org/system/files/fast23Test-kim-yoona.pdf

الإتاحة: https://doi.org/20.500.11750/47806Test
https://doi.org/10.5555/3585938.3585966Test
https://hdl.handle.net/20.500.11750/47806Test
https://www.usenix.org/system/files/fast23Test-kim-yoona.pdf

المؤلفون: Kim, Myungsuk, Park, Jisung, Cho, Genhee, Kim, Yoona, Orosa, Lois, Mutlu, Onur, Kim, Jihong

المساهمون: Samsung Research Funding & Incubation Center

المصدر: Proceedings of the Twenty-Fifth International Conference on Architectural Support for Programming Languages and Operating Systems

الإتاحة: https://doi.org/10.1145/3373376.3378490Test

المؤلفون: Shim, Youngseop, Kim, Myungsuk, Chun, Myoungjun, Park, Jisung, Kim, Yoona, Kim, Jihong

المصدر: Proceedings of the 52nd Annual IEEE/ACM International Symposium on Microarchitecture

الإتاحة: https://doi.org/10.1145/3352460.3358311Test

المؤلفون: Yun, Huichan, Kim, Jinhyung, Kim, Yoona, Jeong, Seulgi, Lim, Sanghak, Yu, Jeong Yun

المصدر: 2018 China Semiconductor Technology International Conference (CSTIC)

الإتاحة: https://doi.org/10.1109/cstic.2018.8369206Test
http://xplorestaging.ieee.org/ielx7/8360436/8369163/08369206.pdf?arnumber=8369206Test

المؤلفون: Yun, Huichan, Kim, Jinhyung, Park, Youjung, Kim, Yoona, Jeong, Seulgi, Baek, Jaeyeol, Yoon, Byeri, Lim, Sanghak

المساهمون: Hohle, Christoph K., Gronheid, Roel

المصدر: SPIE Proceedings ; Advances in Patterning Materials and Processes XXXIV ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2257880Test

المؤلفون: Kim, Yoona, Kim, Ki-Hyung, Shon, Taeshik, Kim, Jai-Hoon

المصدر: 2015 International Conference on Information Networking (ICOIN)

الإتاحة: https://doi.org/10.1109/icoin.2015.7057928Test
http://xplorestaging.ieee.org/ielx7/7051394/7057846/07057928.pdf?arnumber=7057928Test