المؤلفون: Ki, Yong-Kul, Kim, Yong-Ho, Kim, Yong-Chan

المصدر: Proceedings of the 26th FRUCT conference 26 539-544

مصطلحات موضوعية: Travel speed, Imputation, missing data, ITS

العلاقة: https://zenodo.org/communities/fructTest; https://zenodo.org/record/4007420Test; https://doi.org/10.5281/zenodo.4007420Test; oai:zenodo.org:4007420

الإتاحة: https://doi.org/10.5281/zenodo.4007420Test
https://doi.org/10.5281/zenodo.4007419Test
https://zenodo.org/record/4007420Test

المؤلفون: Changkwian, Amornrat, Kwon, Jin-Kyung, Han, Ji-Woong, Lee, Joung-Ho, Choi, Gyung-Ja, Kim, Yong-Ho, Kang, Byoung-Cheorl

المساهمون: 권진경, 한지웅, 이정호, 최경자, 김용호, 강병철

مصطلحات موضوعية: Molecular Mapping of the Root-Knot Nematode (Meloidogyne incognita) Resistance Gene Me7 in Pepper and Histological Characterization of the Parental Lines, 농수해양

العلاقة: http://hdl.handle.net/10371/117455Test

الإتاحة: http://hdl.handle.net/10371/117455Test

المؤلفون: Choi, Ji-Woong, Lee, Yong-Hwan, Kim, Yong-Ho

المساهمون: 최지웅, 이용환, 김용호

مصطلحات موضوعية: DS-CDMA, Orthogonal, Random, Spreading Sequences

العلاقة: ICC 2001. IEEE International Conference on Communications, vol. 5, pp. 1446-1450, 2001; https://hdl.handle.net/10371/7550Test

الإتاحة: https://doi.org/10.1109/ICC.2001.937160Test
https://hdl.handle.net/10371/7550Test

المؤلفون: Kang, S.H. Kang, Soo Hyeok, Kim, Y.H. Kim, Yong Ho, Lee, E.J. Lee, Eun Jin, Lee, S.-G. Lee, Soon Geul, Min, B.-C. Min, Byung Cheol, An, J. An, Jin Ung, Kim, D.H. Kim, Dong Han

المساهمون: An, J. An, Jin Ung, Kang, S.H. Kang, Soo Hyeok, Kim, Y.H. Kim, Yong Ho, Lee, E.J. Lee, Eun Jin, Lee, S.-G. Lee, Soon Geul, Min, B.-C. Min, Byung Cheol, Kim, D.H. Kim, Dong Han

العلاقة: 5th International Conference on Automation, Robotics and Applications, ICARA 2011, pp.46 - 51; http://hdl.handle.net/20.500.11750/1830Test; 2-s2.0-84863127458; 38; 143; 46; 51; 5th International Conference on Automation, Robotics and Applications, ICARA 2011; US; Wellington

الإتاحة: https://doi.org/20.500.11750/1830Test
https://doi.org/10.1109/ICARA.2011.6144854Test
https://hdl.handle.net/20.500.11750/1830Test

المؤلفون: Lim, Y.W. Lim, Yun Won, Kim, Y.H. Kim, Yong Ho, An, J.U. An, Jin Ung, Kim, D.H. Kim, Dong Han

المساهمون: An, J.U. An, Jin Ung, Lim, Y.W. Lim, Yun Won, Kim, Y.H. Kim, Yong Ho, Kim, D.H. Kim, Dong Han

العلاقة: 13th FIRA Robot World Congress on Trends in Intelligent Robotics, FIRA 2010, v.103 CCIS, pp.226 - 233; http://hdl.handle.net/20.500.11750/1846Test; 2-s2.0-78149231636; 82; 143; 103 CCIS; 226; 233; 13th FIRA Robot World Congress on Trends in Intelligent Robotics, FIRA 2010; GE; Bangalore

الإتاحة: https://doi.org/20.500.11750/1846Test
https://doi.org/10.1007/978-3-642-15810-0_29Test
https://hdl.handle.net/20.500.11750/1846Test

المؤلفون: Kang, Soo Hyeok, Kim, Yong Ho, Min, Byung Cheol, Lee, Soon Geul, An, Jinung, Kim, Dong Han

العلاقة: http://hdl.handle.net/20.500.11750/47382Test; 2-s2.0-84883668061; 5th International Conference on Automation, Robotics and Applications (ICARA 2011), pp.205 - 215; https://link.springer.com/book/10.1007/978-3-642-37387-9Test

الإتاحة: https://doi.org/20.500.11750/47382Test
https://doi.org/10.1007/978-3-642-37387-9_16Test
https://hdl.handle.net/20.500.11750/47382Test

المؤلفون: Carrera, Jorge A., Carpenter, Arthur C., Herrmann, Hans W., Hernandez, Jose E., Lopez, Frank E., Griego, Jeffrey R., Kim, Yong Ho H., Gales, Steve A., Horsfield, Colin J., Milnes, James S., Zylstra, Alex B., Beeman, Bart V., Khater, Hesham Y., Hares, Jonathan D., Sitaraman, S.

المساهمون: Koch, Jeffrey A., Grim, Gary P.

المصدر: Target Diagnostics Physics and Engineering for Inertial Confinement Fusion VI

الإتاحة: https://doi.org/10.1117/12.2276865Test

المؤلفون: Chen, Kai-Hsiung, Huang, Guo-Tsai, Hsieh, Hung-Chih, Ni, Wei-Feng, Chuang, S. M., Chuang, T. K., Ke, Chih-Ming, Huang, Jacky, Rao, Shiuan-An, Cumurcu Gysen, Aysegul, d'Alfonso, Maxime, Yueh, Jenny, Izikson, Pavel, Soco, Aileen, Wu, Jon, Nooitgedagt, Tjitte, Ottens, Jeroen, Kim, Yong Ho, Ebert, Martin

المساهمون: Sanchez, Martha I., Ukraintsev, Vladimir A.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXXI ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2257894Test

المؤلفون: Kang, Soo Hyeok, Kim, Yong Ho, Min, Byung Cheol, Lee, Soon Geul, An, Jin Ung, Kim, Dong Han

المساهمون: 080021, An, Jin Ung, Kang, Soo Hyeok, Kim, Yong Ho, Min, Byung Cheol, Lee, Soon Geul, Kim, Dong Han

العلاقة: v.480, pp.205 - 215; http://hdl.handle.net/20.500.11750/1781Test; 2-s2.0-84883668061; 39; 080021; 480; 205; 215; GE

الإتاحة: https://doi.org/20.500.11750/1781Test
https://doi.org/10.1007/978-3-642-37387-9_16Test
https://hdl.handle.net/20.500.11750/1781Test

المؤلفون: Kang, Soo Hyeok, Kim, Yong Ho, Lee, Eun Jin, Lee, Soon Geul, Min, Byung Cheol, An, Jin Ung, Kim, Dong Han

المساهمون: 080021, An, Jin Ung, Kang, Soo Hyeok, Kim, Yong Ho, Lee, Eun Jin, Lee, Soon Geul, Min, Byung Cheol, Kim, Dong Han

العلاقة: 5th International Conference on Automation, Robotics and Applications, ICARA 2011, pp.46 - 51; http://hdl.handle.net/20.500.11750/1829Test; 2-s2.0-84863127458; 38; 080021; 46; 51; 5th International Conference on Automation, Robotics and Applications, ICARA 2011; US; Wellington

الإتاحة: https://doi.org/20.500.11750/1829Test
https://doi.org/10.1109/ICARA.2011.6144854Test
https://hdl.handle.net/20.500.11750/1829Test