المؤلفون: Spencer, Jaime, Qian, C. Stella, Trescakova, Michaela, Russell, Chris, Hadfield, Simon, Graf, Erich W., Adams, Wendy J., Schofield, Andrew J., Elder, James, Bowden, Richard, Anwar, Ali, Chen, Hao, Chen, Xiaozhi, Cheng, Kai, Dai, Yuchao, Hoa, Huynh Thai, Hossain, Sadat, Huang, Jianmian, Jing, Mohan, Li, Bo, Li, Chao, Li, Baojun, Liu, Zhiwen, Mattoccia, Stefano, Mercelis, Siegfried, Nam, Myungwoo, Poggi, Matteo, Qi, Xiaohua, Ren, Jiahui, Tang, Yang, Tosi, Fabio, Trinh, Linh, Uddin, S. M. Nadim, Umair, Khan Muhammad, Wang, Kaixuan, Wang, Yufei, Wang, Yixing, Xiang, Mochu, Xu, Guangkai, Yin, Wei, Yu, Jun, Zhang, Qi, Zhao, Chaoqiang

المساهمون: Spencer, Jaime, Qian, C. Stella, Trescakova, Michaela, Russell, Chri, Hadfield, Simon, Graf, Erich W., Adams, Wendy J., Schofield, Andrew J., Elder, Jame, Bowden, Richard, Anwar, Ali, Chen, Hao, Chen, Xiaozhi, Cheng, Kai, Dai, Yuchao, Hoa, Huynh Thai, Hossain, Sadat, Huang, Jianmian, Jing, Mohan, Li, Bo, Li, Chao, Li, Baojun, Liu, Zhiwen, Mattoccia, Stefano, Mercelis, Siegfried, Nam, Myungwoo, Poggi, Matteo, Qi, Xiaohua, Ren, Jiahui, Tang, Yang, Tosi, Fabio, Trinh, Linh, Uddin, S. M. Nadim, Umair, Khan Muhammad, Wang, Kaixuan, Wang, Yufei, Wang, Yixing, Xiang, Mochu, Xu, Guangkai, Yin, Wei, Yu, Jun, Zhang, Qi, Zhao, Chaoqiang

مصطلحات موضوعية: depth estimation, deep learning

وصف الملف: ELETTRONICO

العلاقة: ispartofbook:Proceedings of IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2023); IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR); firstpage:3064; lastpage:3076; numberofpages:13; serie:IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS; https://hdl.handle.net/11585/961736Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85167705538; https://ieeexplore.ieee.org/document/10208890Test

الإتاحة: https://doi.org/10.1109/cvprw59228.2023.00308Test
https://hdl.handle.net/11585/961736Test
https://ieeexplore.ieee.org/document/10208890Test

المؤلفون: Qin, Yu, Mao, Yang, Han, Yuxin, Cheng, Kai, Shi, Jiangcheng

المصدر: BIO Web of Conferences; 5/31/2024, Vol. 111, p1-14, 14p

المؤلفون: Lin, Chih-Wei, Lu, Cheng-Kai, Tang, Tong Boon

المصدر: 2024 10th International Conference on Applied System Innovation (ICASI)

الإتاحة: https://doi.org/10.1109/icasi60819.2024.10547964Test
http://xplorestaging.ieee.org/ielx8/10547719/10547721/10547964.pdf?arnumber=10547964Test

المؤلفون: Chang, Po-Hsiang, Lu, Cheng-Kai, Tang, Tong Boon, Lin, Chih-Wei

المصدر: 2024 10th International Conference on Applied System Innovation (ICASI)

الإتاحة: https://doi.org/10.1109/icasi60819.2024.10547762Test
http://xplorestaging.ieee.org/ielx8/10547719/10547721/10547762.pdf?arnumber=10547762Test

المؤلفون: Cheng, Kai-Wen, Liu, You-Jin, Hsieh, E Ray

المصدر: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)

الإتاحة: https://doi.org/10.1109/vlsitsa60681.2024.10546464Test
http://xplorestaging.ieee.org/ielx8/10546337/10546338/10546464.pdf?arnumber=10546464Test

المؤلفون: Chiu, Shao-Chien, Peng, Mark, Wei, Yuan-Chung, Cheng, Kai-Yuan, Chen, To-Yu, Chou, Heng-Yu, Wu, Meng-Che, Su, Kuan Hua, Shushan, Nofar, Mizrahi, Assaf, Maurya, Sidharth, Danieli, Guy, Reut, Gilad

المصدر: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

الإتاحة: https://doi.org/10.1109/asmc61125.2024.10545367Test
http://xplorestaging.ieee.org/ielx8/10545359/10545360/10545367.pdf?arnumber=10545367Test

المؤلفون: Yang, Chunhui, Zhang, Weijiao, Cheng, Kai, Li, Chaoxu

المصدر: 2024 IEEE 3rd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA)

الإتاحة: https://doi.org/10.1109/eebda60612.2024.10485855Test
http://xplorestaging.ieee.org/ielx7/10485650/10485652/10485855.pdf?arnumber=10485855Test

المؤلفون: Cheng, Kai-Cheng, Chang, Soon-Jyh, Chen, Chung-Chieh, Hung, Shuo-Hong

المصدر: 2024 IEEE International Solid-State Circuits Conference (ISSCC)

الإتاحة: https://doi.org/10.1109/isscc49657.2024.10454362Test
http://xplorestaging.ieee.org/ielx7/10454133/10454267/10454362.pdf?arnumber=10454362Test

المؤلفون: Wang, Shao-Ru, Hsu, Chen-Chien, Peng, Cheng-Wei, Lu, Cheng-Kai

المساهمون: Ministry of Education, National Science and Technology Council

المصدر: 2024 IEEE International Conference on Consumer Electronics (ICCE)

الإتاحة: https://doi.org/10.1109/icce59016.2024.10444451Test
http://xplorestaging.ieee.org/ielx7/10444098/10444131/10444451.pdf?arnumber=10444451Test

المؤلفون: Hsu, Min-Hang, Hsu, Chen-Chien, Lu, Cheng-Kai, Huang, Shao-Kang

المساهمون: National Taiwan Normal University, National Science and Technology Council

المصدر: 2024 IEEE International Conference on Consumer Electronics (ICCE)

الإتاحة: https://doi.org/10.1109/icce59016.2024.10444197Test
http://xplorestaging.ieee.org/ielx7/10444098/10444131/10444197.pdf?arnumber=10444197Test