CUT&RUN Profiling of the Budding Yeast Epigenome

التفاصيل البيبلوغرافية
العنوان: CUT&RUN Profiling of the Budding Yeast Epigenome
المؤلفون: Brahma, Sandipan, Henikoff, Steven
المصدر: Methods in Molecular Biology ; Yeast Functional Genomics ; page 129-147 ; ISSN 1064-3745 1940-6029 ; ISBN 9781071622568 9781071622575
بيانات النشر: Springer US
سنة النشر: 2022
الوصف: Mapping the epigenome is key to describe the relationship between chromatin landscapes and the control of DNA-based cellular processes such as transcription. Cleavage under targets and release using nuclease (CUT&RUN) is an in situ chromatin profiling strategy in which controlled cleavage by antibody-targeted Micrococcal Nuclease solubilizes specific protein-DNA complexes for paired-end DNA sequencing. When applied to budding yeast, CUT&RUN profiling yields precise genome-wide maps of histone modifications, histone variants, transcription factors, and ATP-dependent chromatin remodelers, while avoiding cross-linking and solubilization issues associated with the most commonly used chromatin profiling technique Chromatin Immunoprecipitation (ChIP). Furthermore, targeted chromatin complexes cleanly released by CUT&RUN can be used as input for a subsequent native immunoprecipitation step (CUT&RUN.ChIP) to simultaneously map two epitopes in single molecules genome-wide. The intrinsically low background and high resolution of CUT&RUN and CUT&RUN.ChIP allows for identification of transient genomic features such as dynamic nucleosome-remodeling intermediates. Starting from cells, one can perform CUT&RUN or CUT&RUN.ChIP and obtain purified DNA for sequencing library preparation in 2 days.
نوع الوثيقة: book part
اللغة: unknown
ردمك: 978-1-07-162256-8
978-1-07-162257-5
1-07-162256-0
1-07-162257-9
DOI: 10.1007/978-1-0716-2257-5_9
الإتاحة: https://doi.org/10.1007/978-1-0716-2257-5_9Test
حقوق: https://creativecommons.org/licenses/by/4.0Test ; https://creativecommons.org/licenses/by/4.0Test ; https://creativecommons.org/licenses/by/4.0Test ; https://creativecommons.org/licenses/by/4.0Test
رقم الانضمام: edsbas.3BC98FFE
قاعدة البيانات: BASE
الوصف
ردمك:9781071622568
9781071622575
1071622560
1071622579
DOI:10.1007/978-1-0716-2257-5_9