دورية أكاديمية

Wrinkle-Free Single-Crystal Graphene Wafer Grown on Strain-Engineered Substrates

التفاصيل البيبلوغرافية
العنوان: Wrinkle-Free Single-Crystal Graphene Wafer Grown on Strain-Engineered Substrates
المؤلفون: Deng B, 庞振乾, Chen SL, Li X, Meng CX, Li JY, Liu MXi, Wu JX, Qi Y, Dang WHi, Yang H, Zhang YF, Zhang J, Kang N, Xu HQ, Fu Q, Qiu XH, Gao P, 魏宇杰, Liu ZF, Peng HL
سنة النشر: 2017
المجموعة: IMECH-IR (Institute of Mechanics, Chinese Academy of Sciences) / 中国科学院力学研究所机构知识库
مصطلحات موضوعية: Graphene Wrinkle, Ultraflat, Strain Engineering, Single Crystal, Thermal Mismatch, Chemical-vapor-deposition, Thermal-expansion, Copper Foils, Monolayer Graphene, Raman-spectroscopy, Layer Graphene, Films, Relaxation, Cu, Oxygen, Chemistry, Science & Technology - Other Topics, Materials Science, Multidisciplinary, Physical, Nanoscience & Nanotechnology, 一类
الوصف: Wrinkles are ubiquitous for graphene films grown on various substrates by chemical vapor deposition at high temperature due to the strain induced by thermal mismatch between the graphene and substrates, which greatly degrades the extraordinary properties of graphene. Here we show that the wrinkle formation of graphene grown on Cu substrates is strongly dependent on the crystallographic orientations. Wrinkle-free single-crystal graphene was grown on a wafer-scale twin-boundary-free single-crystal Cu(111) thin film fabricated on sapphire substrate through strain engineering. The wrinkle-free feature of graphene originated from the relatively small thermal expansion of the Cu(111) thin film substrate and the relatively strong interfacial coupling between Cu(111) and graphene, based on the strain analyses as well as molecular dynamics simulations. Moreover, we demonstrated the transfer of an ultraflat graphene film onto target substrates from the reusable single-crystal Cu(111)/sapphire growth substrate. The wrinkle-free graphene shows enhanced electrical mobility compared to graphene with wrinkles.
نوع الوثيقة: article in journal/newspaper
report
اللغة: English
العلاقة: ACS NANO; http://dspace.imech.ac.cn/handle/311007/72252Test
DOI: 10.1021/acsnano.7b06196
الإتاحة: https://doi.org/10.1021/acsnano.7b06196Test
http://dspace.imech.ac.cn/handle/311007/72252Test
رقم الانضمام: edsbas.7A85F90D
قاعدة البيانات: BASE