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1دورية أكاديمية
المؤلفون: Rödel, Tobias Chris, Fortuna, Franck, Sengupta, Shamashis, Frantzeskakis, Emmanouil, Fèvre, Patrick Le, Bertran, François, Mercey, Bernard, Matzen, Sylvia, Agnus, Guillaume, Maroutian, Thomas, Lecoeur, Philippe, Santander-Syro, Andrés Felipe
المصدر: Advanced Materials; 3/9/2016, Vol. 28 Issue 10, p1976-1980, 5p
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2دورية أكاديمية
المؤلفون: Le, Phu Tran Phong, Hofhuis, Kevin, Rana, Abhimanyu, Huijben, Mark, Hilgenkamp, Hans, Rijnders, Guus A.J.H.M., ten Elshof, Johan E., Koster, Gertjan, Gauquelin, Nicolas, Lumbeeck, Gunnar, Schüßler‐Langeheine, Christian, Popescu, Horia, Fortuna, Franck, Smit, Steef, Verbeek, Xanthe H., Araizi‐Kanoutas, Georgios, Mishra, Shrawan, Vaskivskyi, Igor, Dürr, Hermann A., Golden, Mark S.
المصدر: Advanced Functional Materials; 1/3/2020, Vol. 30 Issue 1, pN.PAG-N.PAG, 1p
مصطلحات موضوعية: SOFT X rays, VANADIUM dioxide, BACKSCATTERING, SILICON nitride, TRANSMISSION electron microscopes, METAL-insulator transitions, ELECTRON diffraction, X-ray absorption