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1دورية أكاديمية
المؤلفون: Whitfield, Pamela S., Le Page, Yvon, Grice, Joel D., Stanley, Chris J., Jones, Gary C., Rumsey, Michael S., Blake, Chris, Roberts, Andrew C., Stirling, John A. R., Carpenter, Gordon J. C.
المصدر: Acta Crystallographica: Section B (Wiley-Blackwell); Jun2007, Vol. 63 Issue 3, p396-401, 6p, 5 Diagrams, 2 Charts, 1 Graph
مصطلحات موضوعية: SILICATE minerals, NEUTRON diffraction, HYDROGEN, ATOMS, RIETVELD refinement, X-ray crystallography technique
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2دورية أكاديمية
المؤلفون: Mata, Ignasi, Espinosa, Enrique, Molins, Elies, Veintemillas, Sabino, Maniukiewicz, Waldemar, Lecomte, Claude, Cousson, Alain, Paulus, Werner
المصدر: Acta Crystallographica: Section A (Wiley-Blackwell); Sep2006, Vol. 62 Issue 5, p365-378, 14p, 4 Diagrams, 6 Charts, 4 Graphs, 1 Map
مصطلحات موضوعية: CRYSTALLOGRAPHY, ELECTRON distribution, NEUTRON diffraction, X-ray crystallography technique, CRYSTAL growth
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3دورية أكاديمية
المؤلفون: Guilmeau, Emmanuel, Chateigner, Daniel, Noudem, Jacques, Funahashi, Ryoji, Horii, Shigeru, Ouladdiaf, Bachir
المصدر: Journal of Applied Crystallography; Feb2005, Vol. 38 Issue 1, p199-210, 12p, 14 Diagrams, 3 Charts
مصطلحات موضوعية: CERAMICS, BISMUTH, X-ray diffraction, NEUTRON diffraction, POSITION sensitive particle detectors, RIETVELD refinement, X-ray crystallography technique