المؤلفون: Abunahla, Heba, Abbas, Yawar, Gebregiorgis, Anteneh, Waheed, Waqas, Mohammad, Baker, Hamdioui, Said, Alazzam, Anas, Rezeq, Moh'd

المصدر: Scientific Reports; 12/5/2023, Vol. 13 Issue 1, p1-9, 9p

مصطلحات موضوعية: ARTIFICIAL neural networks, DEEP learning, BIOLOGICALLY inspired computing, MEMRISTORS, ARTIFICIAL intelligence, LONG-term memory

المؤلفون: Copetti, Thiago, Cardoso Medeiros, Guilherme, Taouil, Mottaqiallah, Hamdioui, Said, Bolzani Poehls, Letícia, Balen, Tiago

المصدر: Journal of Electronic Testing; Jun2021, Vol. 37 Issue 3, p383-394, 12p

المؤلفون: Cortez, Mafalda, Roelofs, Gijs, Hamdioui, Said, Natale, Giorgio

المصدر: Journal of Electronic Testing; Oct2014, Vol. 30 Issue 5, p581-594, 14p

المؤلفون: Hamdioui, Said

المصدر: Mathematical & Engineering Methods in Computer Science; 2013, p32-42, 11p

المؤلفون: Taouil, Mottaqiallah¹ M.Taouil@tudelft.nl, Hamdioui, Said¹ S.Hamdioui@tudelft.nl

المصدر: Journal of Electronic Testing. Aug2012, Vol. 28 Issue 4, p523-534. 12p.

مصطلحات موضوعية: *INTEGRATED circuits, *SEMICONDUCTOR wafers, *MICROPROCESSORS, *COMPUTER storage devices, *INDUSTRIAL costs

المؤلفون: Taouil, Mottaqiallah¹ M.Taouil@tudelft.nl, Hamdioui, Said¹ S.Hamdioui@tudelft.nl, Beenakker, Kees¹ C.I.M.Beenakker@tudelft.nl, Marinissen, Erik² erik.jan.marinissen@imec.be

المصدر: Journal of Electronic Testing. Feb2012, Vol. 28 Issue 1, p15-25. 11p.

مصطلحات موضوعية: *SEMICONDUCTOR wafers, *ALGEBRAIC stacks, *MICROELECTRONICS, *INTEGRATED circuits, *MANUFACTURING industries

المؤلفون: Hamdioui, Said, Van De Goor, Ad

المصدر: Journal of Electronic Testing; Oct2000, Vol. 16 Issue 5, p487-498, 12p

المؤلفون: Gizopoulos, Dimitris¹ dgizop@di.uoa.gr, Hamdioui, Said² S.Hamdioui@tudelft.nl, Manhaeve, Hans³ hans.manhaeve@ridgetop.eu

المصدر: Journal of Electronic Testing. Apr2013, Vol. 29 Issue 2, p125-126. 2p.

مصطلحات موضوعية: *HOT carriers, *INTEGRATED circuits