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المؤلفون: Jason P. Heym, Jesse L. Wei, Jeff W. Lichtman, Jose-Angel Conchello
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Microscope, business.industry, Cone of light, Near-field optics, law.invention, Optical axis, Optics, Tilt (optics), Cardinal point, law, Near-field scanning optical microscope, Profilometer, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::cca523d99c248316091bf0216763d263Test
https://doi.org/10.1117/12.271256Test -
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المؤلفون: Jeff W. Lichtman, Qinrong Yu, Jose-Angel Conchello
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microscope, genetic structures, business.industry, Aperture, Confocal, Scanning confocal electron microscopy, Physics::Optics, law.invention, Optical axis, Optics, law, Confocal microscopy, Microscopy, 4Pi microscope, business, Mathematics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::554aa4857c0f763162c2bbd362594b67Test
https://doi.org/10.1117/12.188057Test