المؤلفون: Kenworthy, M. A., Absil, Olivier, Carlomagno, Brunella, Agócs, T., Por, E. H., Bos, S., Brandl, B., Snik, F.

المساهمون: STAR - Space sciences, Technologies and Astrophysics Research - ULiège

المصدر: urn:isbn:9781510619579
Ground-based and Airborne Instrumentation for Astronomy VII, 10702A3 (2018-07-16); SPIE Astronomical Telescopes + Instrumentation 2018, Austin, TX, United States [US], 10 - 15 June 2018

مصطلحات موضوعية: ELT, High contrast imaging, Coronagraphs, Thermal IR, Physical, chemical, mathematical & earth Sciences, Space science, astronomy & astrophysics, Physique, chimie, mathématiques & sciences de la terre, Aérospatiale, astronomie & astrophysique

العلاقة: info:eu-repo/grantAgreement/EC/FP7/337569; http://adsabs.harvard.edu/abs/2018SPIE10702E..A3KTest

الوصول الحر: https://orbi.uliege.be/handle/2268/232463Test

المؤلفون: Long, J.D., Males, J.R., Haffert, S.Y., Close, L.M., Morzinski, K.M., Van, Gorkom, K., Lumbres, J., Foster, W., Hedglen, A., Kautz, M., Rodack, A., Schatz, L., Miller, K., Doelman, D., Bos, S., Kenworthy, M.A., Snik, F., Otten, G.P.P.L.

المساهمون: Steward Observatory, University of Arizona, Wyant College of Optical Sciences, University of Arizona

المصدر: Proceedings of SPIE - The International Society for Optical Engineering

مصطلحات موضوعية: coronagraphy, high-performance computing, post-processing

العلاقة: Joseph D. Long, Jared R. Males, Sebastiaan Y. Haffert, Laird M. Close, Katie M. Morzinski, Kyle Van Gorkom, Jennifer Lumbres, Warren Foster, Alexander Hedglen, Maggie Kautz, Alex Rodack, Lauren Schatz, Kelsey Miller, David Doelman, Steven P. Bos, Matthew A. Kenworthy, Frans Snik, Gilles P. P. L. Otten, "XPipeline: starlight subtraction at scale for MagAO-X," Proc. SPIE 12185, Adaptive Optics Systems VIII, 121853P (29 August 2022); https://doi.org/10.1117/12.2628975Test; http://hdl.handle.net/10150/671668Test; Proceedings of SPIE - The International Society for Optical Engineering

الإتاحة: https://doi.org/10.1117/12.2628975Test
http://hdl.handle.net/10150/671668Test

المؤلفون: Guyon, O., Norris, B., Martinod, M.-A., Ahn, K., Tuthill, P., Males, J., Wong, A., Skaf, N., Currie, T., Miller, K., Bos, S., Lozi, J., Deo, V., Vievard, S., Belikov, R., Van Gorkom, K., Haffert, S., Mazin, B., Bottom, M., Frazin, R., Rodack, A., Groff, T., Jovanovic, N., Martinache, F.

المساهمون: College of Optical Sciences, University of Arizona, Steward Observatory, University of Arizona

المصدر: Proceedings of SPIE - The International Society for Optical Engineering

العلاقة: Guyon, O., Norris, B., Martinod, M.-A., Ahn, K., Tuthill, P., Males, J., Wong, A., Skaf, N., Currie, T., Miller, K., Bos, S., Lozi, J., Deo, V., Vievard, S., Belikov, R., Van Gorkom, K., Haffert, S., Mazin, B., Bottom, M., … Martinache, F. (2021). High contrast imaging at the photon noise limit with self-calibrating WFS/C systems. Proceedings of SPIE - The International Society for Optical Engineering.; http://hdl.handle.net/10150/662393Test; Proceedings of SPIE - The International Society for Optical Engineering

الإتاحة: https://doi.org/10.1117/12.2594885Test
http://hdl.handle.net/10150/662393Test

المؤلفون: Landis, S., Teyssedre, H., Claveau, G., Servin, I., Delachat, F., Pourteau, M. L., Gharbi, A., Pimenta Barros, P., Tiron, R., Nouri, L., Possemé, N., May, M., Brianceau, P., Barnola, S., Blancquaert, Y., Pradelles, J., Essomba, P., Bernadac, A., Dal'zotto, B., Bos, S., Argoud, M., Chamiot-Maitral, G., Sarrazin, A., Tallaron, C., Lapeyre, C., Pain, L.

المساهمون: Engelmann, Sebastian U., Wise, Rich S.

المصدر: SPIE Proceedings ; Advanced Etch Technology for Nanopatterning VI ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2259966Test

المؤلفون: Teyssedre, H., Landis, S., Thanner, C., Schauer, V., Laure, M., Zorbach, W., Pain, L., Bos, S., Eibelhuber, M., Wimplinger, M.

المساهمون: Behringer, Uwe F.W., Finders, Jo

المصدر: 32nd European Mask and Lithography Conference ; SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2250194Test

المؤلفون: Gharbi, A., Tiron, R., Argoud, M., Chamiot-Maitral, G., Fouquet, A., Lapeyre, C., Pimenta Barros, P., Sarrazin, A., Servin, I., Delachat, F., Bos, S., Bérard-Bergery, S., Hazart, J., Chevalier, X., Nicolet, C., Navarro, C., Cayrefourcq, I., Bouanani, S., Monget, C.

المساهمون: Bencher, Christopher, Cheng, Joy Y.

المصدر: SPIE Proceedings ; Alternative Lithographic Technologies VIII ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2219210Test

المؤلفون: Tiron, R., Gharbi, A., Pimenta Barros, P., Bouanani, S., Lapeyre, C., Bos, S., Fouquet, A., Hazart, J., Chevalier, X., Argoud, M., Chamiot-Maitral, G., Barnola, S., Monget, C., Farys, V., Berard-Bergery, S., Perraud, L., Navarro, C., Nicolet, C., Hadziioannou, G., Fleury, G.

المساهمون: Resnick, Douglas J., Bencher, Christopher

المصدر: Alternative Lithographic Technologies VII ; SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2085819Test

المؤلفون: Pimenta Barros, P., Gharbi, A., Sarrazin, A., Tiron, R., Posseme, N., Barnola, S., Bos, S., Tallaron, C., Claveau, G., Chevalier, X., Argoud, M., Servin, I., Navarro, C., Nicolet, C., Lapeyre, C., Monget, C.

المساهمون: Lin, Qinghuang, Engelmann, Sebastian U., Zhang, Ying

المصدر: SPIE Proceedings ; Advanced Etch Technology for Nanopatterning IV ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2086810Test

المؤلفون: Hazart, J., Chesneau, N., Evin, G., Largent, A., Derville, A., Thérèse, R., Bos, S., Bouyssou, R., Dezauzier, C., Foucher, J.

المساهمون: Cain, Jason P., Sanchez, Martha I.

المصدر: Metrology, Inspection, and Process Control for Microlithography XXVIII ; SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2046484Test