التفاصيل البيبلوغرافية
| العنوان: |
Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation. |
| المؤلفون: |
Fiala, Pavel, Bartušek, Karel, Dědková, Jarmila, Kadlec, Radim, Dohnal, Přemysl |
| المصدر: |
Measurement Science Review; Aug2019, Vol. 19 Issue 4, p144-152, 9p |
| مصطلحات موضوعية: |
ELECTROMAGNETIC waves, COMPUTATIONAL electromagnetics, ELECTROMAGNETIC spectrum, GAMMA rays, ELECTROMAGNETIC wave propagation |
| مستخلص: |
We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
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