دورية أكاديمية
High spatial resolution ellipsometer for characterization of epitaxial graphene.
| العنوان: | High spatial resolution ellipsometer for characterization of epitaxial graphene. |
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| المؤلفون: | Gaskell, Peter E., Skulason, Helgi S., Strupinski, Wlodek, Szkopek, Thomas |
| المصدر: | Optics Letters; 10/15/2010, Vol. 35 Issue 20, p34-34, 1p |
| قاعدة البيانات: | Supplemental Index |
| تدمد: | 01469592 |
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| DOI: | 10.1364/OL.35.003336 |