Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy
| العنوان: | Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy |
|---|---|
| المؤلفون: | Liang Shen, Yu Luo, Weiping Han, Minrui Zheng, Anjam Khursheed, Amit Banerjee |
| المصدر: | Scientific Reports Scientific Reports, Vol 11, Iss 1, Pp 1-2 (2021) |
| بيانات النشر: | Nature Publishing Group UK, 2021. |
| سنة النشر: | 2021 |
| مصطلحات موضوعية: | Multidisciplinary, Materials science, Material analysis, Science, Medicine, Author Correction, Energy (signal processing), Secondary electrons, Computational physics |
| الوصف: | This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary beam voltages. The technique uses an electron energy analyser attachment to detect small changes in the shape of the scattered secondary electron (SE) spectrum and extract out fine structure features from it. Close agreement between experimental and theoretical bulk valance band DOS distributions was obtained for six different test samples, where the normalised root mean square deviation ranged from 2.7 to 6.7%. High accuracy levels of this kind do not appear to have been reported before. The results presented in this paper point towards SEES becoming a quantitative material analysis companion tool for low voltage scanning electron microscopy (LVSEM) and providing new applications for Scanning Auger Microscopy (SAM) instruments. |
| اللغة: | English |
| تدمد: | 2045-2322 |
| الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ce884317116b080c44f1c4bcef25ba2Test http://europepmc.org/articles/PMC8016860Test |
| حقوق: | OPEN |
| رقم الانضمام: | edsair.doi.dedup.....2ce884317116b080c44f1c4bcef25ba2 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 20452322 |
|---|