دورية أكاديمية
The Sliding-Aperture Transform and Its Applicability to Deep-Level Transient Spectroscopy
| العنوان: | The Sliding-Aperture Transform and Its Applicability to Deep-Level Transient Spectroscopy |
|---|---|
| المؤلفون: | Buchwald, Walter R., Peale, Robert E., Grant, Perry C., Logan, Julie V., Webster, Preston T., Morath, Christian P. |
| المساهمون: | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering |
| المصدر: | Multidisciplinary Digital Publishing Institute |
| بيانات النشر: | Multidisciplinary Digital Publishing Institute |
| سنة النشر: | 2022 |
| المجموعة: | DSpace@MIT (Massachusetts Institute of Technology) |
| الوصف: | A mathematical method is presented for the extraction of defect parameters from the multiexponential decays generated during deep-level transient spectroscopy experiments. Such transient phenomenon results from the ionization of charge trapped in defects located in the depletion width of a semiconductor diode. From digitized transients acquired at fixed temperatures, this method produces a rate–domain spectral signature associated with all defects in the semiconductor. For signal-to-noise ratio of 1000, defect levels with carrier emission rates differing by as little as 1.5 times may be distinguished. |
| نوع الوثيقة: | article in journal/newspaper |
| وصف الملف: | application/pdf |
| اللغة: | unknown |
| العلاقة: | http://dx.doi.org/10.3390/app12115317Test; https://hdl.handle.net/1721.1/142797Test; Applied Sciences 12 (11): 5317 (2022); PUBLISHER_CC |
| الإتاحة: | https://doi.org/10.3390/app12115317Test https://hdl.handle.net/1721.1/142797Test |
| حقوق: | Creative Commons Attribution ; https://creativecommons.org/licenses/by/4.0Test |
| رقم الانضمام: | edsbas.678ACBAB |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |