المؤلفون: Whelan, Patrick R., Zhou, Binbin, Bezencenet, Odile, Shivayogimath, Abhay, Mishra, Neeraj, Shen, Qian, Jessen, Bjarke S., Pasternak, Iwona, Mackenzie, David M.A., Ji, Jie, Sun, Cunzhi, Seneor, Pierre, Dlubak, Bruno, Luo, Birong, Østerberg, Frederik W., Huang, Deping, Shi, Haofei, Luo, Da, Wang, Meihui, Ruoff, Rodney S., Conran, Ben R., McAleese, Clifford, Huyghebaert, Cedric, Brems, Steven, Booth, Timothy J., Napal, Ilargi, Strupinski, Wlodek, Petersen, Dirch H., Forti, Stiven, Coletti, Camilla, Jouvray, Alexandre, Teo, Kenneth B.K., Centeno, Alba, Zurutuza, Amaia, Legagneux, Pierre, Jepsen, Peter U., Bøggild, Peter

المساهمون: Department of Electronics and Nanoengineering, Harri Lipsanen Group, Technical University of Denmark, Thales, Italian Institute of Technology, Warsaw University of Technology, Université Paris-Saclay, Tianjin Normal University, Chinese Academy of Sciences, Institute for Basic Science, Aixtron SE, IMEC Vzw, Graphenea S.A., Aalto-yliopisto, Aalto University

مصطلحات موضوعية: CVD grapheme, electrical mapping, large-scale grapheme, terahertz spectroscopy

وصف الملف: application/pdf

العلاقة: 2D Materials; Volume 8, issue 2; Whelan, P R, Zhou, B, Bezencenet, O, Shivayogimath, A, Mishra, N, Shen, Q, Jessen, B S, Pasternak, I, Mackenzie, D M A, Ji, J, Sun, C, Seneor, P, Dlubak, B, Luo, B, Østerberg, F W, Huang, D, Shi, H, Luo, D, Wang, M, Ruoff, R S, Conran, B R, McAleese, C, Huyghebaert, C, Brems, S, Booth, T J, Napal, I, Strupinski, W, Petersen, D H, Forti, S, Coletti, C, Jouvray, A, Teo, K B K, Centeno, A, Zurutuza, A, Legagneux, P, Jepsen, P U & Bøggild, P 2021, ' Case studies of electrical characterisation of graphene by terahertz time-domain spectroscopy ', 2D Materials, vol. 8, no. 2, 022003 . https://doi.org/10.1088/2053-1583/abdbcbTest; PURE UUID: 6adef636-cff4-488b-ad6b-639f89f593f5; PURE ITEMURL: https://research.aalto.fi/en/publications/6adef636-cff4-488b-ad6b-639f89f593f5Test; PURE LINK: http://www.scopus.com/inward/record.url?scp=85101506041&partnerID=8YFLogxKTest; PURE FILEURL: https://research.aalto.fi/files/56944800/Whelan_2021_2D_Mater_8_022003.pdfTest; https://aaltodoc.aalto.fi/handle/123456789/103208Test; URN:NBN:fi:aalto-202103222486

الإتاحة: https://doi.org/10.1088/2053-1583/abdbcbTest
https://aaltodoc.aalto.fi/handle/123456789/103208Test

المؤلفون: Mackenzie, David M.A., Kalhauge, Kristoffer G., Whelan, Patrick R., Østergaard, Frederik W., Pasternak, Iwona, Strupinski, Wlodek, Bøggild, Peter, Jepsen, Peter U., Petersen, Dirch H.

المساهمون: Harri Lipsanen Group, Danmarks Tekniske Universitet, CAPRES—A KLA Company, Warsaw University of Technology, ENT SA, Department of Electronics and Nanoengineering, Aalto-yliopisto, Aalto University

وصف الملف: application/pdf

العلاقة: info:eu-repo/grantAgreement/EC/H2020/785219/EU//GrapheneCore2; Nanotechnology; Volume 31, issue 22; Mackenzie , D M A , Kalhauge , K G , Whelan , P R , Østergaard , F W , Pasternak , I , Strupinski , W , Bøggild , P , Jepsen , P U & Petersen , D H 2020 , ' Wafer-scale graphene quality assessment using micro four-point probe mapping ' , Nanotechnology , vol. 31 , no. 22 , 225709 . https://doi.org/10.1088/1361-6528/ab7677Test; PURE UUID: 8f399276-2993-4726-a9e7-25e50e83c462; PURE ITEMURL: https://research.aalto.fi/en/publications/8f399276-2993-4726-a9e7-25e50e83c462Test; PURE LINK: http://www.scopus.com/inward/record.url?scp=85082095763&partnerID=8YFLogxKTest; PURE FILEURL: https://research.aalto.fi/files/42140395/Mackenzie_2020_Nanotechnology_31_225709.pdfTest; https://aaltodoc.aalto.fi/handle/123456789/43891Test

الإتاحة: https://doi.org/10.1088/1361-6528/ab7677Test
https://aaltodoc.aalto.fi/handle/123456789/43891Test