المؤلفون: Martikkala, Antti, Wiikinkoski, Olli, Asadi, Reza, Queguineur, Antoine, Ylä-Autio, Aapo, Flores Ituarte, Inigo

المساهمون: Tampere University, Automation Technology and Mechanical Engineering

مصطلحات موضوعية: 216 Materials engineering, 213 Electronic, automation and communications engineering, electronics

وصف الملف: fulltext

العلاقة: IOP Conference Series: Materials Science and Engineering; 1296; ORCID: /0000-0002-1641-3198/work/152643144; ORCID: /0000-0002-1940-7527/work/152643213; ORCID: /0000-0001-8307-5080/work/152643410; https://trepo.tuni.fi/handle/10024/154868Test; URN:NBN:fi:tuni-202402082203; https://nolamp19.fiTest/; https://iopscience.iop.org/issue/1757-899X/1296/1Test

الإتاحة: https://doi.org/10.1088/1757-899X/1296/1/012006Test
https://trepo.tuni.fi/handle/10024/154868Test
https://nolamp19.fiTest/
https://iopscience.iop.org/issue/1757-899X/1296/1Test

المؤلفون: Tuominen, Jari, Hallaji, Mohammad, Kiviö, Jouko, Vihinen, Jorma

المساهمون: Tampere University, Materials Science and Environmental Engineering, Automation Technology and Mechanical Engineering

مصطلحات موضوعية: 216 Materials engineering, 213 Electronic, automation and communications engineering, electronics

وصف الملف: fulltext

العلاقة: IOP Conference Series: Materials Science and Engineering; 1296; ORCID: /0000-0001-7396-727X/work/150415877; https://trepo.tuni.fi/handle/10024/154072Test; URN:NBN:fi:tuni-202401101304

الإتاحة: https://doi.org/10.1088/1757-899X/1296/1/012037Test
https://trepo.tuni.fi/handle/10024/154072Test

المؤلفون: Asadi, Reza, Queguineur, Antoine, Ylä-Autio, Aapo, Martikkala, Antti, Wiikinkoski, Olli, Mokhtarian, Hossein, Flores Ituarte, Inigo

المساهمون: Tampere University, Automation Technology and Mechanical Engineering

مصطلحات موضوعية: 216 Materials engineering, 213 Electronic, automation and communications engineering, electronics

وصف الملف: fulltext

العلاقة: IOP Conference Series: Materials Science and Engineering; 1296; ORCID: /0000-0002-1641-3198/work/152643141; ORCID: /0000-0002-1940-7527/work/152643212; ORCID: /0000-0001-8307-5080/work/152643409; ORCID: /0000-0002-6818-9044/work/152643424; https://trepo.tuni.fi/handle/10024/154867Test; URN:NBN:fi:tuni-202402072185; https://nolamp19.fiTest/; https://iopscience.iop.org/issue/1757-899X/1296/1Test

الإتاحة: https://doi.org/10.1088/1757-899X/1296/1/012005Test
https://trepo.tuni.fi/handle/10024/154867Test
https://nolamp19.fiTest/
https://iopscience.iop.org/issue/1757-899X/1296/1Test

المؤلفون: The CMS collaboration, Adam, W., Eerola, P., Heikkilä, J., Brucken, E., Lampen, T., Luukka, P., Martikainen, L., Pekkanen, J., Tuominen, E., Tuuva, T.

المساهمون: Department of Physics, Helsinki Institute of Physics, Eija Tuominen / Principal Investigator

مصطلحات موضوعية: Data acquisition concepts, Detector control systems (detector and experiment monitoring and slow-control systems, architecture, hardware, algorithms, databases), Modular electronics, Optical detector readout concepts, READOUT, 213 Electronic, automation and communications engineering, electronics

وصف الملف: application/pdf

العلاقة: The tracker groups gratefully acknowledge financial support from the following funding agencies: BMWFW and FWF (Austria); FNRS and FWO (Belgium); CERN; MSE and CSF (Croatia); Academy of Finland, MEC, and HIP (Finland); CEA and CNRS/IN2P3 (France); BMBF, DFG, and HGF (Germany); GSRT (Greece); OTKA K124850, NIH, and Bolyai Fellowship of the HungarianAcademy of Sciences (Hungary); DAE and DST (India); IPM (Iran); INFN (Italy); PAEC (Pakistan); SEIDI, CPAN, PCTI and FEDER (Spain); Swiss Funding Agencies (Switzerland); MST (Taipei); STFC (United Kingdom); DOE and NSF (U.S.A.). Individuals have received support from HFRI (Greece).; The CMS Collaboration , Adam , W , Eerola , P , Heikkilä , J , Brucken , E , Lampen , T , Luukka , P , Martikainen , L , Pekkanen , J , Tuominen , E & Tuuva , T 2019 , ' The DAQ and control system for the CMS Phase-1 pixel detector upgrade ' , Journal of Instrumentation , vol. 14 , 10017 . https://doi.org/10.1088/1748-0221/14/10/P10017Test; ORCID: /0000-0002-7073-7767/work/68613100; ORCID: /0000-0003-1609-3515/work/68618379; ORCID: /0000-0002-0538-1469/work/103359882; ORCID: /0000-0001-6066-8756/work/159031559; http://hdl.handle.net/10138/311177Test; 89fb01c5-3fc5-4426-bb83-520812311017; 000501798100017

الإتاحة: http://hdl.handle.net/10138/311177Test

المؤلفون: Zhao Fu, Panu Tanninen, Jari Keskinen, Roman Lev, Ville Leminen, Matti Mäntysalo

المساهمون: Tampere University, Electrical Engineering

المصدر: Flexible and Printed Electronics. 8:025004

مصطلحات موضوعية: 213 Electronic, automation and communications engineering, electronics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

وصف الملف: fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed4d2e752d53598fc6f0a15e202855fcTest
https://doi.org/10.1088/2058-8585/accc9bTest

المؤلفون: Gao, Xinyu, Li, Nan, Kyritsakis, Andreas, Veske, Mihkel, Dong, Chengye, Wu, Kai, Xiao, Bing, Djurabekova, Flyura, Cheng, Yonghong

المساهمون: Helsinki Institute of Physics, Department of Physics

مصطلحات موضوعية: 213 Electronic, automation and communications engineering, electronics, 114 Physical sciences

وصف الملف: application/pdf

العلاقة: B Xiao is supported by the National Science Foundation of China (51807146) and the Young Talent Support Plan of Xi'an Jiaotong University (DQ1J009). A K and F D acknowledge the financial support of the CERN K-contract (No. 47207461). AK was also supported by the European Union's Horizon 2020 program under Grant No. 856705 (ERA Chair 'MATTER'). The high performance computing center at Xi'an Jiaotong University is especially acknowledged for providing the computational resources.; Gao , X , Li , N , Kyritsakis , A , Veske , M , Dong , C , Wu , K , Xiao , B , Djurabekova , F & Cheng , Y 2022 , ' Structural evolution and thermal runaway of refractory W and Mo nanotips in the vacuum under high electric field from PIC-ED-MD simulations ' , Journal of Physics. D, Applied Physics , vol. 55 , no. 33 , 335201 . https://doi.org/10.1088/1361-6463/ac7177Test; ORCID: /0000-0002-5828-200X/work/124027195; ORCID: /0000-0002-4334-5450/work/124032893; 85131414780; e61e15d3-67d1-498f-a625-70867d7104f7; http://hdl.handle.net/10138/350960Test; 000802690500001

الإتاحة: http://hdl.handle.net/10138/350960Test

المؤلفون: Salvador Esque, Emilio Ruiz, Olli Suominen, Mohammad M. Aref, Jouni Mattila, Longchuan Niu

المساهمون: Tampere University, Automation and Hydraulic Engineering, Signal Processing, Research group: Innovative Hydraulic Automation, Doctoral Programme in Engineering Sciences

المصدر: IOP Conference Series: Materials Science and Engineering. 320:012007

مصطلحات موضوعية: Open Control Architecture, Computer science, 213 Electronic, automation and communications engineering, electronics, Context (language use), 01 natural sciences, 010305 fluids & plasmas, law.invention, Industrial robot, Industrial PC, law, Control theory, Robustness (computer science), 0103 physical sciences, Torque sensor, 010306 general physics, Simulation, Haptic technology

وصف الملف: fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d39fd7b1a735b34da281bbbb778c9b2dTest
https://doi.org/10.1088/1757-899x/320/1/012007Test

المؤلفون: Mohammad M. Aref, Juho Vihonen, Ioan Tabus, Jouni Mattila, Pekka Astola, Reza Ghabcheloo

المساهمون: Tampere University, Automation and Hydraulic Engineering, Research group: Innovative Hydraulic Automation, Signal Processing

المصدر: IOP Conference Series: Materials Science and Engineering. 320:012009

مصطلحات موضوعية: Visual perception, business.industry, Computer science, Machine vision, 213 Electronic, automation and communications engineering, electronics, Coordinate system, Motion control, Object detection, Noise, Variable (computer science), Local coordinates, Computer vision, Artificial intelligence, business

وصف الملف: fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a31cb0be491cf72cc9273ad3be63ddabTest
https://doi.org/10.1088/1757-899x/320/1/012009Test

المؤلفون: Mari Lehti-Polojärvi, Aku Seppänen, Olli Koskela, Jari Hyttinen, Edite Figueiras

المساهمون: Tampere University, Faculty of Biomedical Sciences and Engineering, Research group: Computational Biophysics and Imaging Group

المصدر: Measurement Science and Technology. 29:025401

مصطلحات موضوعية: Surface (mathematics), Computer science, business.industry, Image quality, 213 Electronic, automation and communications engineering, electronics, Applied Mathematics, Acoustics, 0206 medical engineering, Experimental data, Window (computing), 02 engineering and technology, Inverse problem, 020601 biomedical engineering, 01 natural sciences, 010309 optics, Set (abstract data type), Optics, 0103 physical sciences, Electrode, business, Instrumentation, Engineering (miscellaneous), Electrical impedance tomography

وصف الملف: fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ddc75834da517e416f0f705bf6e541d7Test
https://doi.org/10.1088/1361-6501/aa97f1Test

المؤلفون: Jari Juuti, Juha-Veikko Voutilainen, Mikko Nelo, Jaakko Palosaari, Tapio Fabritius, Juho Pörhönen, Sampo Tuukkanen, Heli Jantunen, Pauliina Vilmi

المساهمون: Tampere University, Department of Electronics and Communications Engineering, Department of Automation Science and Engineering, Research area: Microsystems, Research area: Measurement Technology and Process Control

المصدر: Flexible and Printed Electronics. 1:025002

مصطلحات موضوعية: Resistive touchscreen, Voltage doubler, Fabrication, Materials science, 213 Electronic, automation and communications engineering, electronics, Nanotechnology, Memristor, Substrate (printing), Electronic, Optical and Magnetic Materials, law.invention, law, visual_art, Electronic component, visual_art.visual_art_medium, Polymer substrate, Electronics, Electrical and Electronic Engineering

وصف الملف: fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57e7d85a03eb377debdef130b49ccadeTest
https://doi.org/10.1088/2058-8585/1/2/025002Test