دورية أكاديمية

Optimization of a solid-state electron spin qubit using gate set tomography

التفاصيل البيبلوغرافية
العنوان: Optimization of a solid-state electron spin qubit using gate set tomography
المؤلفون: Juan P Dehollain, Juha T Muhonen, Robin Blume-Kohout, Kenneth M Rudinger, John King Gamble, Erik Nielsen, Arne Laucht, Stephanie Simmons, Rachpon Kalra, Andrew S Dzurak, Andrea Morello
المصدر: New Journal of Physics, Vol 18, Iss 10, p 103018 (2016)
بيانات النشر: IOP Publishing, 2016.
سنة النشر: 2016
المجموعة: LCC:Science
LCC:Physics
مصطلحات موضوعية: quantum computing, silicon, tomography, 03.65.Wj, 03.67.Ac, 03.67.Lx, Science, Physics, QC1-999
الوصف: State of the art qubit systems are reaching the gate fidelities required for scalable quantum computation architectures. Further improvements in the fidelity of quantum gates demands characterization and benchmarking protocols that are efficient, reliable and extremely accurate. Ideally, a benchmarking protocol should also provide information on how to rectify residual errors. Gate set tomography (GST) is one such protocol designed to give detailed characterization of as-built qubits. We implemented GST on a high-fidelity electron-spin qubit confined by a single ^31 P atom in ^28 Si. The results reveal systematic errors that a randomized benchmarking analysis could measure but not identify, whereas GST indicated the need for improved calibration of the length of the control pulses. After introducing this modification, we measured a new benchmark average gate fidelity of $99.942(8) \% $ , an improvement on the previous value of $99.90(2) \% $ . Furthermore, GST revealed high levels of non-Markovian noise in the system, which will need to be understood and addressed when the qubit is used within a fault-tolerant quantum computation scheme.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 1367-2630
العلاقة: https://doaj.org/toc/1367-2630Test
DOI: 10.1088/1367-2630/18/10/103018
الوصول الحر: https://doaj.org/article/20b88b157e5442c5afdf73124287b1b5Test
رقم الانضمام: edsdoj.20b88b157e5442c5afdf73124287b1b5
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:13672630
DOI:10.1088/1367-2630/18/10/103018