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1دورية أكاديمية
المؤلفون: Minnella, Filippo, Cortadella, Jordi, Casu, Mario R., Lazarescu, Mihai T., Lavagno, Luciano
المساهمون: Universitat Politècnica de Catalunya. Departament de Ciències de la Computació, Universitat Politècnica de Catalunya. ALBCOM - Algorísmia, Bioinformàtica, Complexitat i Mètodes Formals
مصطلحات موضوعية: Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats, Integrated circuits -- Design and construction, Integrated circuit synthesis, Design automation, Sequential circuits, Latches, Flip-flops, Circuits integrats -- Disseny i construcció
وصف الملف: 11 p.; application/pdf
العلاقة: https://ieeexplore.ieee.org/document/10097737Test; Minnella, F. [et al.]. Mix & Latch: An optimization flow for high-performance designs with single-clock mixed-polarity latches and flip-flops. "IEEE access", 10 Abril 2023, vol. 11, p. 35830-35840.; http://hdl.handle.net/2117/387551Test
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2دورية أكاديمية
المؤلفون: Lagostina, Lorenzo, Minnella, Filippo, Cortadella, Jordi, Casu, Mario R., Lazarescu, Mihai T., Lavagno, Luciano
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; volume 43, issue 7, page 2229-2233 ; ISSN 0278-0070 1937-4151
الإتاحة: https://doi.org/10.1109/tcad.2024.3360314Test
http://xplorestaging.ieee.org/ielx7/43/10564796/10418169.pdf?arnumber=10418169Test -
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المصدر: IEEE Transactions on Instrumentation and Measurement. 58:255-262
مصطلحات موضوعية: Signal processing, Engineering, Health management system, Seven Management and Planning Tools, business.industry, Feature extraction, Maintainability, Sensor fusion, System monitoring, Life testing, Reliability engineering, Automatic test equipment, Data acquisition, Robustness (computer science), Component (UML), Server, Systems engineering, Signal processing algorithms, Prognostics, Automated reasoning, Electrical and Electronic Engineering, business, Instrumentation
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b31b92dfb7898c3e6fa4c959230785f6Test
https://doi.org/10.1109/tim.2008.2005966Test -
4دورية أكاديمية
المؤلفون: Baybutt, M., Minnella, C., Ginart, A.E., Kalgren, P.W., Roemer, M.J.
المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 58, issue 2, page 255-262 ; ISSN 0018-9456 1557-9662
مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation
الإتاحة: https://doi.org/10.1109/tim.2008.2005966Test
http://xplorestaging.ieee.org/ielx5/19/4740169/04685874.pdf?arnumber=4685874Test