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1
المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology. 12:610-615
مصطلحات موضوعية: Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::13fec5c3d6b81f1a7c55654b70dcf3aaTest
https://doi.org/10.1109/tcpmt.2022.3162398Test -
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المؤلفون: Luke D. Doucette, R.R. Kennard, Dean J. Smith, Tyler P. Martin, Carl P. Tripp
المصدر: IEEE Sensors Journal. 10:720-727
مصطلحات موضوعية: Detection limit, Spectrometer, Chemistry, Microorganism, Electrostatic precipitation, Detector, Analytical chemistry, Infrared spectroscopy, Electrical and Electronic Engineering, Spectroscopy, Instrumentation, Particle detector
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5f3494e9aa6066680b00974b38b7c827Test
https://doi.org/10.1109/jsen.2009.2038570Test -
3
المؤلفون: Carl P. Tripp, V.C.G. Reddy, Eric G. Roy, Luke D. Doucette
المصدر: IEEE Sensors Journal. 10:604-607
مصطلحات موضوعية: Detection limit, Aqueous solution, Silicon, Chemistry, Infrared, Analytical chemistry, Parts-per notation, chemistry.chemical_element, Infrared spectroscopy, Electrical and Electronic Engineering, Thin film, Spectroscopy, Instrumentation
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::24c14824e97c8ea0057d45f9bf8145f0Test
https://doi.org/10.1109/jsen.2009.2038653Test