المؤلفون: Renaudin, Valerie, Ortiz, Miguel, Perul, Johan, Torres-Sospedra, Joaquin, Jimenez, Antonio Ramon, Perez-Navarro, Antoni, Martin Mendoza-Silva, German, Seco, Fernando, Landau, Yael, Marbel, Revital, Ben-Moshe, Boaz, Zheng, Xingyu, Ye, Feng, Kuang, Jian, Li, Yu, Niu, Xiaoji, Landa, Vlad, Hacohen, Shlomi, Shvalb, Nir, Lu, Chuanhua, Uchiyama, Hideaki, Thomas, Diego, Shimada, Atsushi, Taniguchi, Rin-Ichiro, Ding, Zhenxing, Xu, Feng, Kronenwett, Nikolai, Vladimirov, Blagovest, Lee, Soyeon, Cho, Eunyoung, Jun, Sungwoo, Lee, Changeun, Park, Sangjoon, Lee, Yonghyun, Rew, Jehyeok, Park, Changjun, Jeong, Hyeongyo, Han, Jaeseung, Lee, Keumryeol, Zhang, Wenchao, Li, Xianghong, Wei, Dongyan, Zhang, Ying, Park, So Young, Park, Chan Gook, Knauth, Stefan, Pipelidis, Georgios, Tsiamitros, Nikolaos, Lungenstrass, Tomas, Morales, Juan Pablo

المصدر: IEEE Access ; volume 7, page 148594-148628 ; ISSN 2169-3536

الإتاحة: https://doi.org/10.1109/access.2019.2944389Test
http://xplorestaging.ieee.org/ielx7/6287639/8600701/08852722.pdf?arnumber=8852722Test

المؤلفون: Renaudin, Valerie, Potorti, Francesco, Torres-Sospedra, Joaquin, Knauth, Stefan, O'keefe, Kyle, Park, Chan Gook, Sugimoto, Masanori, Wei, Dongyan, Nurmi, Jari

المصدر: IEEE Sensors Journal ; volume 22, issue 6, page 4754-4754 ; ISSN 1530-437X 1558-1748 2379-9153

مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation

الإتاحة: https://doi.org/10.1109/jsen.2022.3150130Test
http://xplorestaging.ieee.org/ielx7/7361/9733818/09733819.pdf?arnumber=9733819Test

المؤلفون: Mendoza-Silva, German Martin, Torres-Sospedra, Joaquin, Potorti, Francesco, Moreira, Adriano, Knauth, Stefan, Berkvens, Rafael, Huerta, Joaquin

المساهمون: Universitat Jaume I, Ministerio de Ciencia, Innovación y Universidades

المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 70, page 1-11 ; ISSN 0018-9456 1557-9662

الإتاحة: https://doi.org/10.1109/tim.2020.3021514Test
http://xplorestaging.ieee.org/ielx7/19/9259274/09186638.pdf?arnumber=9186638Test