المؤلفون: Park, Seonhee, Yu, Soohwan, Kim, Minseo, Park, Kwanwoo, Paik, Joonki

المساهمون: Institute for Information & Communications Technology Promotion grant through the Korea government, Intelligent Defense Boundary Surveillance Technology Using Collaborative Reinforced Learning of Embedded Edge Camera and Image Analysis

المصدر: IEEE Access ; volume 6, page 22084-22093 ; ISSN 2169-3536

الإتاحة: https://doi.org/10.1109/access.2018.2812809Test
http://xplorestaging.ieee.org/ielx7/6287639/8274985/08307190.pdf?arnumber=8307190Test

المؤلفون: Kim, Minseo

المصدر: IEEE Transactions on Network Science and Engineering ; volume 8, issue 3, page 2316-2325 ; ISSN 2327-4697 2334-329X

مصطلحات موضوعية: Computer Networks and Communications, Computer Science Applications, Control and Systems Engineering

الإتاحة: https://doi.org/10.1109/tnse.2021.3087334Test
http://xplorestaging.ieee.org/ielx7/6488902/9541107/09448467.pdf?arnumber=9448467Test

المؤلفون: Kim, Kwantae, Kim, Ji-Hoon, Gweon, Surin, Kim, Minseo, Yoo, Hoi-Jun

المساهمون: Institute for Information & communications Technology Promotion(IITP) grant, Korea government, On-device Instant Learning Complex Intelligence Processor Architecture and ADAS Design for Self-driving Platform)

المصدر: IEEE Journal of Solid-State Circuits ; volume 55, issue 8, page 2161-2173 ; ISSN 0018-9200 1558-173X

مصطلحات موضوعية: Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/jssc.2020.2991511Test
http://xplorestaging.ieee.org/ielx7/4/9146394/09094195.pdf?arnumber=9094195Test

المؤلفون: Shin, Joongchol, Kim, Minseo, Paik, Joonki, Lee, Sangkeun

المساهمون: Ministry of Science and ICT, South Korea, National Research Foundation of Korea, Ministry of Science ICT and Future Planning

المصدر: IEEE Transactions on Multimedia ; volume 22, issue 1, page 30-44 ; ISSN 1520-9210 1941-0077

الإتاحة: https://doi.org/10.1109/tmm.2019.2922127Test
http://xplorestaging.ieee.org/ielx7/6046/8949825/08734728.pdf?arnumber=8734728Test

المؤلفون: Jang, Jaeeun, Lee, Jihee, Lee, Kyoung-Rog, Lee, Jiwon, Kim, Minseo, Lee, Yongsu, Bae, Joonsung, Yoo, Hoi-Jun

المساهمون: Institute for Information and communications Technology Promotion

المصدر: IEEE Journal of Solid-State Circuits ; volume 54, issue 2, page 538-549 ; ISSN 0018-9200 1558-173X

الإتاحة: https://doi.org/10.1109/jssc.2018.2873630Test
http://xplorestaging.ieee.org/ielx7/4/8629373/08502781.pdf?arnumber=8502781Test

المؤلفون: Ha, Unsoo, Lee, Jaehyuk, Kim, Minseo, Roh, Taehwan, Choi, Sangsik, Yoo, Hoi-Jun

المصدر: IEEE Journal of Solid-State Circuits ; volume 53, issue 6, page 1830-1843 ; ISSN 0018-9200 1558-173X

الإتاحة: https://doi.org/10.1109/jssc.2018.2810213Test
http://xplorestaging.ieee.org/ielx7/4/8364639/08320516.pdf?arnumber=8320516Test

المؤلفون: Kim, Minseo, Ha, Unsoo, Lee, Kyuho Jason, Lee, Yongsu, Yoo, Hoi-Jun

المصدر: IEEE Journal of Solid-State Circuits ; volume 52, issue 7, page 1953-1965 ; ISSN 0018-9200 1558-173X

الإتاحة: https://doi.org/10.1109/jssc.2017.2694833Test
http://xplorestaging.ieee.org/ielx7/4/7956372/07919157.pdf?arnumber=7919157Test

المؤلفون: Kim, Minseo, Jang, Jaeeun, Kim, Hyunki, Lee, Jihee, Lee, Jaehyuck, Lee, Jiwon, Lee, Kyoung-Rog, Kim, Kwantae, Lee, Yongsu, Lee, Kyuho Jason, Yoo, Hoi-Jun

المساهمون: Institute for Information and Communications Technology Promotion (IITP) grant through the Korea Government (MSIT)

المصدر: IEEE Journal of Solid-State Circuits ; volume 52, issue 11, page 2829-2842 ; ISSN 0018-9200 1558-173X

الإتاحة: https://doi.org/10.1109/jssc.2017.2753234Test
http://xplorestaging.ieee.org/ielx7/4/8081776/08057579.pdf?arnumber=8057579Test

المؤلفون: Lee, Yongsu, Lee, Hyeonwoo, Jang, Jaeeun, Lee, Jihee, Kim, Minseo, Lee, Jaehyuk, Kim, Hyunki, Yoo, Seunghyup, Yoo, Hoi-Jun

المساهمون: Open Innovation Lab Project from National Nanofab Center (NNFC)

المصدر: IEEE Journal on Emerging and Selected Topics in Circuits and Systems ; volume 7, issue 1, page 50-59 ; ISSN 2156-3357 2156-3365

مصطلحات موضوعية: Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/jetcas.2016.2630301Test
http://xplorestaging.ieee.org/ielx7/5503868/7879373/07862230.pdf?arnumber=7862230Test