يعرض 1 - 4 نتائج من 4 نتيجة بحث عن '"Tingzhu Wu"', وقت الاستعلام: 0.70s تنقيح النتائج
  1. 1

    المصدر: IEEE Transactions on Instrumentation and Measurement. 70:1-7

    الوصف: Ultraviolet light-emitting diodes (UV LEDs) have been widely applied in various fields, such as sewage treatment, sterilization, and disinfection medical treatment. However, the remained problems of UV LEDs mainly concern poor photoelectric stability, low efficiency, safety protection, and among others. In order to evaluate and predict the stability and lifetime of UV LEDs safely and efficiently, a comprehensive UV LEDs two-step aging test system has been designed in this work. Two steps of different temperature stresses with total aging time up to 720 h are applied to UV LEDs. The junction temperature derived from spectroscopy has been taken under consideration during the test to evaluate lifetime accurately. A smartphone-based remote control and test scheme has been developed to monitor and control the online testing and therefore ensure the safety and convenience during the aging experiment.

  2. 2

    المصدر: IEEE Electron Device Letters. 40:1132-1135

    الوصف: Spatially resolved electroluminescence emitted through the sapphire substrate of GaN-based flip-chip green microscale light-emitting diodes with $20\times 20\,\,\mu \text{m}^{\text {2}}$ mesas has been collected via microscopic hyperspectral imaging. The current crowding is identified in the central region of the mesa, corresponding to the position of the p-pad. The bright-spot emissions at the edges of the mesa originate from localized potential energy valleys. This letter suggests that the comprehensive information about current crowding and the distribution of the light emission across the mesa of microscale light-emitting diode can be obtained by capturing spatially resolved light emission from the side of the transparent substrate.

  3. 3

    المصدر: IEEE Transactions on Electron Devices. 64:2326-2329

    الوصف: We introduce a new method for measuring the junction temperature of alternating current light-emitting diodes. This method employs a periodic bipolar voltage pulse signal as the input, and utilizes the amplitude of corresponding output current as the temperature sensitive parameter (TSP), of which a linear temperature dependence is proven in a prior experiment in this paper. On the basis of the TSP, we devise a detailed procedure—first, measure the thermal resistance of the package of ac-LEDs, which further contributes to the calculation of junction temperatures under various power inputs. Comparisons between values calculated by using this method and those obtained directly from a thermocouple indicate a decent accuracy of the former. The advantage of this method benefits from the stability of thermal resistance under different driving conditions that one could immediately obtain the junction temperature by measuring the electric and optical powers.

  4. 4

    المصدر: IEEE Transactions on Electron Devices. 64:2257-2260

    الوصف: Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the reflected light. Lock-in technique is utilized to exclude the interference of the emitting light from LEDs under test and to increase the dynamic range greatly. The results are in good agreement with those directly tested by a microthermocouple. To avoid extra carrier absorption and modulation effect, the incident exciting light should harbor smaller bandgap than that of LEDs under test.