Simulation method for reliability of TT&C mission with high redundancy and small time horizon

التفاصيل البيبلوغرافية
العنوان: Simulation method for reliability of TT&C mission with high redundancy and small time horizon
المؤلفون: Shuangwei Xu, Xiaoyue Wu
المصدر: Journal of Systems Engineering and Electronics. 23:943-948
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 2012.
سنة النشر: 2012
مصطلحات موضوعية: Engineering, business.industry, Embedded system, Redundancy (engineering), Time horizon, business
تدمد: 1004-4132
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::30aa097c212e6fa0e13df28280a3638bTest
https://doi.org/10.1109/jsee.2012.00116Test
رقم الانضمام: edsair.doi...........30aa097c212e6fa0e13df28280a3638b
قاعدة البيانات: OpenAIRE