المؤلفون: Gao, Z.X., Yi, J., Sun, J., Wang, Y.L., Zhang, Y.L.

المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)

الإتاحة: https://doi.org/10.1109/icreed.2018.8905049Test
http://xplorestagingTest.ieee.org/ielx7/8896805/8905046/08905049.pdf?arnumber=8905049

المؤلفون: Mao, H.Y., Wu, W.G., Zhang, Y.L., Lv, P.P., Qian, C., Xu, J., Zhang, H.X.

المصدر: 2011 IEEE 24th International Conference on Micro Electro Mechanical Systems

الإتاحة: https://doi.org/10.1109/memsys.2011.5734588Test
http://xplorestagingTest.ieee.org/ielx5/5724748/5734339/05734588.pdf?arnumber=5734588

المؤلفون: Zhang, Y.L., Sun, G.C., Wu, W.G.

المصدر: 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference

الإتاحة: https://doi.org/10.1109/transducers.2011.5969450Test
http://xplorestagingTest.ieee.org/ielx5/5958191/5969118/05969450.pdf?arnumber=5969450

المؤلفون: Qian, C., Ni, C., Zhang, Y.L., Zhou, Y., Wu, W.G., Xu, J., Hao, Y.L.

المصدر: 2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS)

الإتاحة: https://doi.org/10.1109/memsys.2010.5442346Test
http://xplorestagingTest.ieee.org/ielx5/5438531/5442276/05442346.pdf?arnumber=5442346

المؤلفون: Zhang, Y.L., Zhao, Z.W., Liu, F.

المصدر: 2008 6th IEEE International Conference on Industrial Informatics

الإتاحة: https://doi.org/10.1109/indin.2008.4618060Test
http://xplorestagingTest.ieee.org/ielx5/4603797/4618046/04618060.pdf?arnumber=4618060

المؤلفون: Zhang, Y.L., Shi, X.Q., Zhou, W.

المصدر: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)

الإتاحة: https://doi.org/10.1109/eptc.2004.1396642Test
http://xplorestagingTest.ieee.org/ielx5/9607/30353/01396642.pdf?arnumber=1396642

المؤلفون: Lu, D.X., Pun, E.Y.B., Zhang, Y.L., Wong, E.M.W., Chung, P.S., Huang, L.B., Lee, Z.Y.

المصدر: ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics

الإتاحة: https://doi.org/10.1109/isaf.1996.602786Test
http://xplorestagingTest.ieee.org/ielx3/4659/13274/00602786.pdf?arnumber=602786

المؤلفون: Zhang, Y.L., Pun, E.Y.B., Lu, D.X., Wong, E.M.W., Chung, P.S., Mo, D.

المصدر: ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics

الإتاحة: https://doi.org/10.1109/isaf.1996.598110Test
http://xplorestagingTest.ieee.org/ielx3/4659/13054/00598110.pdf?arnumber=598110

المؤلفون: Zhang, Y.L., Yang, S.H.

المصدر: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics; 2009, p1-4, 4p

المؤلفون: Zhang, Y.L., Shi, X.Q., Zhou, W.

المصدر: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971); 2004, p404-409, 6p