المؤلفون: Sakamoto, T., Wakimoto, H.

المصدر: 2008 International Symposium on Power Electronics, Electrical Drives, Automation and Motion

الإتاحة: https://doi.org/10.1109/speedham.2008.4581156Test
http://xplorestagingTest.ieee.org/ielx5/4570841/4581062/04581156.pdf?arnumber=4581156

المؤلفون: Ishida, K., Wakimoto, H., Yoshihara, K., Konno, M., Shimizu, S., Uchitomi, N., Toyoda, N.

المصدر: 11th Annual Gallium Arsenide Integrated Circuit (GaAs IC) Symposium

الإتاحة: https://doi.org/10.1109/gaas.1989.69351Test
http://xplorestagingTest.ieee.org/ielx2/827/2443/00069351.pdf?arnumber=69351

المؤلفون: Nagaoka, M., Wakimoto, H., Seshita, T., Kawakyu, K., Kitaura, Y., Kameyama, A., Uchitomi, N.

المصدر: GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997

الإتاحة: https://doi.org/10.1109/gaas.1997.628235Test
http://xplorestagingTest.ieee.org/ielx3/4970/13666/00628235.pdf?arnumber=628235

المؤلفون: Kirihata, H., Takahashi, Y., Wakimoto, H., Niino, F.

المصدر: Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting (Cat. No.98CH36242)

الإتاحة: https://doi.org/10.1109/ias.1998.730270Test
http://xplorestagingTest.ieee.org/ielx4/5899/15733/00730270.pdf?arnumber=730270

المؤلفون: Nagaoka, M., Wakimoto, H., Kawakyu, K., Nishihori, K., Kitaura, Y., Sasaki, T., Kameyama, A., Uchitomi, N.

المصدر: 1997 IEEE MTT-S International Microwave Symposium Digest

الإتاحة: https://doi.org/10.1109/mwsym.1997.596571Test
http://xplorestagingTest.ieee.org/ielx3/4660/13055/00596571.pdf?arnumber=596571

المؤلفون: Otsuki, M., Momota, S., Kirisawa, M., Wakimoto, H., Seki, Y.

المصدر: 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094)

الإتاحة: https://doi.org/10.1109/ispsd.2000.856812Test
http://xplorestagingTest.ieee.org/ielx5/6912/18590/00856812.pdf?arnumber=856812

المؤلفون: Seshita, T., Kawakyu, K., Wakimoto, H., Nagaoka, M., Kitaura, Y., Uchitomi, N.

المصدر: 1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.98CH36182)

الإتاحة: https://doi.org/10.1109/rfic.1998.682080Test
http://xplorestagingTest.ieee.org/ielx4/5597/14989/00682080.pdf?arnumber=682080

المؤلفون: Seshita, T., Uchitomi, N., Ikeda, Y., Wakimoto, H., Ishida, K., Terada, T., Matsunaga, T., Suzuki, T., Hashimoto, T., Kitaura, Y.

المصدر: Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '94

الإتاحة: https://doi.org/10.1109/isscc.1994.344682Test
http://xplorestagingTest.ieee.org/ielx2/1111/8026/00344682.pdf?arnumber=344682

المؤلفون: Ishida, K., Wakimoto, H., Tomita, K., Kitaura, Y., Suzuki, T., Yoshihara, K., Konno, M., Shimizu, S., Uchitomi, N.

المصدر: 1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

الإتاحة: https://doi.org/10.1109/isscc.1991.689203Test
http://xplorestagingTest.ieee.org/ielx4/520/4021/00689203.pdf?arnumber=689203

المؤلفون: Nakazawa, H., Ogino, M., Wakimoto, H., Nakajima, T., Takahashi, Y., Lu, D.H.

المصدر: 2011 IEEE 23rd International Symposium on Power Semiconductor Devices & ICs (ISPSD); 2011, p116-119, 4p