المؤلفون: Sugihara, A.K., Wada, T., Suda, T., Fujita, M., Kawasaki, S., Mori, O.

المصدر: IGARSS 2023 - 2023 IEEE International Geoscience and Remote Sensing Symposium

الإتاحة: https://doi.org/10.1109/igarss52108.2023.10282466Test
http://xplorestagingTest.ieee.org/ielx7/10281394/10281399/10282466.pdf?arnumber=10282466

المؤلفون: Sugihara, A.K., Wada, T., Suda, T., Nada, Y., Fujita, M., Kawasaki, S., Mori, O.

المصدر: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium

الإتاحة: https://doi.org/10.1109/igarss46834.2022.9884520Test
http://xplorestagingTest.ieee.org/ielx7/9883023/9883024/09884520.pdf?arnumber=9884520

المؤلفون: Takeuchi, Y., Kim, S.H., Iida, T., Asano, C., Wakasa, R., Maekawa, G., Nakahara, S., Yamane, R., Ikeda, H., Wada, T., Nagase, K., Matsuura, S., Arai, Y., Kurachi, I., Hazumi, M., Yoshida, T., Mima, S., Kiuchi, K., Ishino, H., Kibayashi, A., Kato, Y., Fujii, G., Shiki, S., Ukibe, M., Ohkubo, M., Kawahito, S., Ramberg, E., Rubinov, P., Sergatskov, D., Kim, S.B., Kim, Y.H., Lee, H.J.

المساهمون: Ministry of Education

المصدر: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

الإتاحة: https://doi.org/10.1109/vlsi-tsa51926.2021.9440090Test
http://xplorestagingTest.ieee.org/ielx7/9440054/9440040/09440090.pdf?arnumber=9440090

المؤلفون: Inoue, K., Fukuda, T., Wada, T.

المصدر: 2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

الإتاحة: https://doi.org/10.1109/embc.2019.8856490Test
http://xplorestagingTest.ieee.org/ielx7/8844528/8856280/08856490.pdf?arnumber=8856490

المؤلفون: Nakagawa, N., Okada, H., Wada, T., Yamazato, T., Katayama, M.

الإتاحة: http://hdl.handle.net/2237/7753Test

المؤلفون: Inoue, K., Pripunnochai, A., Wada, T.

المصدر: 2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

الإتاحة: https://doi.org/10.1109/embc.2016.7591761Test
http://xplorestagingTest.ieee.org/ielx7/7580725/7590615/07591761.pdf?arnumber=7591761

المؤلفون: Fukui, Y., Wada, T.

المصدر: 2016 IEEE 55th Conference on Decision and Control (CDC)

الإتاحة: https://doi.org/10.1109/cdc.2016.7798371Test
http://xplorestagingTest.ieee.org/ielx7/7786694/7798233/07798371.pdf?arnumber=7798371

المؤلفون: Takai, M., Ishibashi, K., Wada, T.

المصدر: 2014 IEEE Radio and Wireless Symposium (RWS)

الإتاحة: https://doi.org/10.1109/rws.2014.6830100Test
http://xplorestagingTest.ieee.org/ielx7/6821320/6830066/06830100.pdf?arnumber=6830100

المؤلفون: Kumagai, Y., Arvaneh, M., Okawa, H., Wada, T., Tanaka, T.

وصف الملف: text

العلاقة: https://eprints.whiterose.ac.uk/116452/1/EMBC17_1717_FI.pdfTest; Kumagai, Y., Arvaneh, M., Okawa, H. et al. (2 more authors) (2017) Classification of Familiarity Based on Cross-Correlation Features Between EEG and Music. In: 2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC). The 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC’17), 11-15 Jul 2017, Seogwipo, South Korea. IEEE , pp. 2879-2882.

الإتاحة: https://doi.org/10.1109/EMBC.2017.8037458Test
https://eprints.whiterose.ac.uk/116452Test/
https://eprints.whiterose.ac.uk/116452/1/EMBC17_1717_FI.pdfTest

المؤلفون: Suzuki, M., Wada, T., Takahashi, T., Matsushita, T., Onishi, J., Nishida, T., Yoshikawa, Y., Aoyagi, S.

المصدر: 2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS)

الإتاحة: https://doi.org/10.1109/memsys.2012.6170411Test
http://xplorestagingTest.ieee.org/ielx5/6165525/6170071/06170411.pdf?arnumber=6170411